作者的详细信息

Marchenko, D.E.

期 栏目 标题 文件
卷 52, 编号 16 (2018) 26th INTERNATIONAL SYMPOSIUM “NANOSTRUCTURES: PHYSICS AND TECHNOLOGY”. NANOSTRUCTURE CHARACTERIZATION Сomposition Depth Profiling of the GaAs Native Oxide Irradiated by an Ar+ Ion Beam
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