作者的详细信息
Bouravlev, A.
期 | 栏目 | 标题 | 文件 |
卷 53, 编号 2 (2019) | Surfaces, Interfaces, and Thin Films | Photoelectric Properties of GaN Layers Grown by Plasma-Assisted Molecular-Beam Epitaxy on Si(111) Substrates and SiC/Si(111) Epitaxial Layers | |
卷 53, 编号 14 (2019) | Nanostructures Characterization | Matched X-Ray Reflectometry and Diffractometry of Super-Multiperiod Heterostructures Grown by Molecular Beam Epitaxy | |
卷 53, 编号 14 (2019) | Nanostructures Characterization | Photoluminescence and Transmission Electron Microscopy Methods for Characterization of Super-Multiperiod A3B5 Quantum Well Structures |