Информация об авторе
Shvets, V.
| Выпуск | Раздел | Название | Файл |
| Том 53, № 1 (2019) | Fabrication, Treatment, and Testing of Materials and Structures | Ellipsometric Method for Measuring the CdTe Buffer-Layer Temperature in the Molecular-Beam Epitaxy of CdHgTe |