Информация об авторе
Frolov, D.
| Выпуск | Раздел | Название | Файл |
| Том 50, № 3 (2016) | Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena | Investigation of Ion-Implanted Photosensitive Silicon Structures by Electrochemical Capacitance–Voltage Profiling | |
| Том 53, № 2 (2019) | Fabrication, Treatment, and Testing of Materials and Structures | Technique for the Electrochemical Capacitance–Voltage Profiling of Heavily Doped Structures with a Sharp Doping Profile | |
| Том 53, № 10 (2019) | Electronic Properties of Semiconductors | Microwave Magnetic Absorption in HgSe with Co and Ni Impurities |