Автор туралы ақпарат
Yakovlev, G. E.
Шығарылым | Бөлім | Атауы | Файл |
Том 50, № 3 (2016) | Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena | Investigation of Ion-Implanted Photosensitive Silicon Structures by Electrochemical Capacitance–Voltage Profiling | |
Том 52, № 8 (2018) | Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena | Specific Features of the Electrochemical Capacitance–Voltage Profiling of GaAs LED and pHEMT Structures with Quantum-Confined Regions | |
Том 53, № 2 (2019) | Fabrication, Treatment, and Testing of Materials and Structures | Technique for the Electrochemical Capacitance–Voltage Profiling of Heavily Doped Structures with a Sharp Doping Profile |