Автор туралы ақпарат
Bibik, A. Yu.
Шығарылым | Бөлім | Атауы | Файл |
Том 51, № 6 (2017) | XV International Conference “Thermoelectrics and Their Applications—2016”, St. Petersburg, November 15–16, 2016 | On the morphology of the interlayer surface and micro-Raman spectra of layered films in topological insulators based on bismuth telluride |