Computational and Experimental Simulation of Static Memory Cells of Submicron Microcircuits under the Effect of Neutron Fluxes
- Authors: Puzanov A.S.1,2, Venediktov M.M.1,2, Obolenskiy S.V.1,2, Kozlov V.A.1,3
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Affiliations:
- Lobachevsky State University of Nizhny Novgorod
- Branch of the Russian Federal Nuclear Center All-Russian Research Institute “Sedakov Scientific Research Institute of Measurement Systems”
- Institute for Physics of Microstructures, Russian Academy of Sciences
- Issue: Vol 53, No 9 (2019)
- Pages: 1222-1228
- Section: Xxiii International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 11–14, 2019
- URL: https://journals.rcsi.science/1063-7826/article/view/206837
- DOI: https://doi.org/10.1134/S1063782619090173
- ID: 206837
Cite item
Abstract
The simulation of reversible single events in test samples of static memory microcircuits with design norms of 0.5, 0.35, 0.25, and 0.1 μm under the effect of neutron fluxes with various energies is performed. It is shown theoretically and experimentally that reversible single events can occur in modern microelectronics and nanoelectronics products under the effect of a fission-spectrum neutron flux caused by the passage of primary recoil atoms and nuclear reaction products along the microcircuit surface perpendicularly to the electric current lines in the near-drain transistor area. A series of irradiation experiments of static memory circuits with design norms of 0.35 μm is interpreted based on the proposed model.
About the authors
A. S. Puzanov
Lobachevsky State University of Nizhny Novgorod; Branch of the Russian Federal Nuclear Center All-Russian Research Institute “Sedakov Scientific Research Instituteof Measurement Systems”
Author for correspondence.
Email: aspuzanov@inbox.ru
Russian Federation, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950
M. M. Venediktov
Lobachevsky State University of Nizhny Novgorod; Branch of the Russian Federal Nuclear Center All-Russian Research Institute “Sedakov Scientific Research Instituteof Measurement Systems”
Email: aspuzanov@inbox.ru
Russian Federation, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950
S. V. Obolenskiy
Lobachevsky State University of Nizhny Novgorod; Branch of the Russian Federal Nuclear Center All-Russian Research Institute “Sedakov Scientific Research Instituteof Measurement Systems”
Email: aspuzanov@inbox.ru
Russian Federation, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950
V. A. Kozlov
Lobachevsky State University of Nizhny Novgorod; Institute for Physics of Microstructures, Russian Academy of Sciences
Email: aspuzanov@inbox.ru
Russian Federation, Nizhny Novgorod, 603950; Nizhny Novgorod, 603087