Author Details
Kozhemiako, A.
| Issue | Section | Title | File |
| Vol 53, No 6 (2019) | Surfaces, Interfaces, and Thin Films | Features of Defect Formation in Nanostructured Silicon under Ion Irradiation | |
| Vol 53, No 8 (2019) | Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion) | Influence of the Charge State of Xenon Ions on the Depth Distribution Profile Upon Implantation into Silicon |