Informaçao sobre o Autor
Ismailov, A. M.
| Edição | Seção | Título | Arquivo |
| Volume 51, Nº 3 (2017) | Physics of Semiconductor Devices | Specific features of the capacitance–voltage characteristics of a Cu–SiO2–p-InSb MIS structure | |
| Volume 53, Nº 15 (2019) | Electronics Materials | Dependence of the Surface Morphology and Structure of CuIn0.95Ga0.05Se2 Films on the Selenization Temperature |