Informaçao sobre o Autor

Ignatov, P. V.

Edição	Seção	Título	Arquivo
Volume 47, Nº 3 (2018)	Article	Investigating the Dynamic Characteristics of High-Temperature SOI CMOS VLSIC Elements
Volume 47, Nº 3 (2018)	Article	Experimental Evaluation of Reliability of Deep Submicron SOI MOS Transistors at High Temperatures
Volume 47, Nº 5 (2018)	Article	Reliability Investigation of 0.18-μm SOI MOS Transistors at High Temperatures

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