Features of the Current Flow in Injection Structures Based on PbSnTe:In Films


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Abstract

This paper reports a study of the current–voltage (I–V) features of the p-i-p structures based on Pb1–xSnxTe:In films with the tin content х ≈ 0.31 in which the metal–insulator transition occurs. It is shown that the photocurrent is the hole current under light interband excitation, and electron trapping is dominant. The experimental and theoretical data are compared.

About the authors

D. V. Ishchenko

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Author for correspondence.
Email: ischenkod@isp.nsc.ru
Russian Federation, Novosibirsk, 630090

I. G. Neizvestnyi

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: ischenkod@isp.nsc.ru
Russian Federation, Novosibirsk, 630090

N. S. Pashchin

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: ischenkod@isp.nsc.ru
Russian Federation, Novosibirsk, 630090

V. N. Sherstyakova

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: ischenkod@isp.nsc.ru
Russian Federation, Novosibirsk, 630090


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