Features of the Current Flow in Injection Structures Based on PbSnTe:In Films


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This paper reports a study of the current–voltage (I–V) features of the p-i-p structures based on Pb1–xSnxTe:In films with the tin content х ≈ 0.31 in which the metal–insulator transition occurs. It is shown that the photocurrent is the hole current under light interband excitation, and electron trapping is dominant. The experimental and theoretical data are compared.

作者简介

D. Ishchenko

Rzhanov Institute of Semiconductor Physics, Siberian Branch

编辑信件的主要联系方式.
Email: ischenkod@isp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090

I. Neizvestnyi

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: ischenkod@isp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090

N. Pashchin

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: ischenkod@isp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090

V. Sherstyakova

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: ischenkod@isp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090


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