Features of the Current Flow in Injection Structures Based on PbSnTe:In Films
- Авторы: Ishchenko D.1, Neizvestnyi I.1, Pashchin N.1, Sherstyakova V.1
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Учреждения:
- Rzhanov Institute of Semiconductor Physics, Siberian Branch
- Выпуск: Том 47, № 4 (2018)
- Страницы: 221-225
- Раздел: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/186846
- DOI: https://doi.org/10.1134/S1063739718040042
- ID: 186846
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Аннотация
This paper reports a study of the current–voltage (I–V) features of the p-i-p structures based on Pb1–xSnxTe:In films with the tin content х ≈ 0.31 in which the metal–insulator transition occurs. It is shown that the photocurrent is the hole current under light interband excitation, and electron trapping is dominant. The experimental and theoretical data are compared.
Об авторах
D. Ishchenko
Rzhanov Institute of Semiconductor Physics, Siberian Branch
Автор, ответственный за переписку.
Email: ischenkod@isp.nsc.ru
Россия, Novosibirsk, 630090
I. Neizvestnyi
Rzhanov Institute of Semiconductor Physics, Siberian Branch
Email: ischenkod@isp.nsc.ru
Россия, Novosibirsk, 630090
N. Pashchin
Rzhanov Institute of Semiconductor Physics, Siberian Branch
Email: ischenkod@isp.nsc.ru
Россия, Novosibirsk, 630090
V. Sherstyakova
Rzhanov Institute of Semiconductor Physics, Siberian Branch
Email: ischenkod@isp.nsc.ru
Россия, Novosibirsk, 630090