Methods of functional-logic simulation of radiation-induced failures of electronic systems based on the fuzzy state machine model
- Authors: Barbashov V.M.1, Kalashnikov O.A.1
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Affiliations:
- National Research Nuclear University MEPhI
- Issue: Vol 46, No 3 (2017)
- Pages: 155-161
- Section: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/186313
- DOI: https://doi.org/10.1134/S1063739717030027
- ID: 186313
Cite item
Abstract
The methods of functional-logic simulation of radiation-induced failures of electronic systems based on the Brauer fuzzy state machine model are presented. Recommendations for methods of radiationinduced failure prediction in the electronic component base are given. Theoretical and experimental results for the radiation fault tolerance of 1617 large-scale integrated circuits based on complementary metal–oxide–semiconductor structures are given as an example.
About the authors
V. M. Barbashov
National Research Nuclear University MEPhI
Author for correspondence.
Email: VMBarbashov@MEPHI.ru
Russian Federation, Moscow, 115409
O. A. Kalashnikov
National Research Nuclear University MEPhI
Email: VMBarbashov@MEPHI.ru
Russian Federation, Moscow, 115409