Methods of functional-logic simulation of radiation-induced failures of electronic systems based on the fuzzy state machine model
- Авторлар: Barbashov V.1, Kalashnikov O.1
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Мекемелер:
- National Research Nuclear University MEPhI
- Шығарылым: Том 46, № 3 (2017)
- Беттер: 155-161
- Бөлім: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/186313
- DOI: https://doi.org/10.1134/S1063739717030027
- ID: 186313
Дәйексөз келтіру
Аннотация
The methods of functional-logic simulation of radiation-induced failures of electronic systems based on the Brauer fuzzy state machine model are presented. Recommendations for methods of radiationinduced failure prediction in the electronic component base are given. Theoretical and experimental results for the radiation fault tolerance of 1617 large-scale integrated circuits based on complementary metal–oxide–semiconductor structures are given as an example.
Авторлар туралы
V. Barbashov
National Research Nuclear University MEPhI
Хат алмасуға жауапты Автор.
Email: VMBarbashov@MEPHI.ru
Ресей, Moscow, 115409
O. Kalashnikov
National Research Nuclear University MEPhI
Email: VMBarbashov@MEPHI.ru
Ресей, Moscow, 115409