Methods of functional-logic simulation of radiation-induced failures of electronic systems based on the fuzzy state machine model
- 作者: Barbashov V.1, Kalashnikov O.1
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隶属关系:
- National Research Nuclear University MEPhI
- 期: 卷 46, 编号 3 (2017)
- 页面: 155-161
- 栏目: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/186313
- DOI: https://doi.org/10.1134/S1063739717030027
- ID: 186313
如何引用文章
详细
The methods of functional-logic simulation of radiation-induced failures of electronic systems based on the Brauer fuzzy state machine model are presented. Recommendations for methods of radiationinduced failure prediction in the electronic component base are given. Theoretical and experimental results for the radiation fault tolerance of 1617 large-scale integrated circuits based on complementary metal–oxide–semiconductor structures are given as an example.
作者简介
V. Barbashov
National Research Nuclear University MEPhI
编辑信件的主要联系方式.
Email: VMBarbashov@MEPHI.ru
俄罗斯联邦, Moscow, 115409
O. Kalashnikov
National Research Nuclear University MEPhI
Email: VMBarbashov@MEPHI.ru
俄罗斯联邦, Moscow, 115409