Methods of functional-logic simulation of radiation-induced failures of electronic systems based on the fuzzy state machine model
- Авторы: Barbashov V.1, Kalashnikov O.1
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Учреждения:
- National Research Nuclear University MEPhI
- Выпуск: Том 46, № 3 (2017)
- Страницы: 155-161
- Раздел: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/186313
- DOI: https://doi.org/10.1134/S1063739717030027
- ID: 186313
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Аннотация
The methods of functional-logic simulation of radiation-induced failures of electronic systems based on the Brauer fuzzy state machine model are presented. Recommendations for methods of radiationinduced failure prediction in the electronic component base are given. Theoretical and experimental results for the radiation fault tolerance of 1617 large-scale integrated circuits based on complementary metal–oxide–semiconductor structures are given as an example.
Об авторах
V. Barbashov
National Research Nuclear University MEPhI
Автор, ответственный за переписку.
Email: VMBarbashov@MEPHI.ru
Россия, Moscow, 115409
O. Kalashnikov
National Research Nuclear University MEPhI
Email: VMBarbashov@MEPHI.ru
Россия, Moscow, 115409