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编号 8 (2025)

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Articles

Potential of High-Frequency Cathode Sputtering Method for Synthesis of Lead-Containing Antiferroelectric Films

Zhukova N., Ganzha A., Kniazeva M., Filimonov A., Goltaev A., Pavlenko A., Burkovsky R.

摘要

The potential of using the method of high-frequency cathode sputtering in an oxygen atmosphere for the synthesis of thin-film lead-containing antiferroelectric materials is investigated. Two films with the chemical composition of the PbHfO3 target were synthesized on Si(001) and SrRuO3/SrTiO3/MgO(001) substrates. The formed films were characterized by single-crystal X-ray diffraction, including reverse space mapping, and energy dispersive spectroscopy. It has been demonstrated that this synthesis method makes it possible to grow polycrystalline films based on materials with a perovskite structure. In this case, an epitaxial film with rhombic syngony and a new crystal lattice, different from the one known for PbHfO3, was obtained on a heterophase substrate. The revealed ratio of the parameters of the film cells and the intermediate layer is 7 to 6, i.e. the coincidence of the nodes of the film and substrate structure occurs when 7 film cells and 6 cells of the SrRuO3 layer are superimposed. This indicates the complex nature of the orientation. The morphology analysis showed significant differences between the samples in terms of grain size and distribution. The data obtained confirm the high sensitivity of the phase composition to the type of substrate and demonstrate the promise of the high-frequency cathode sputtering method for creating new functional oxide films suitable for use in microelectronics, sensors and energy-efficient devices.
Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques. 2025;(8):3–9
pages 3–9 views

Calculation of the Electron Emission Coefficient during Fast Ion Passage through Silicon

Novikov N., Chechenin N., Shirokova A.

摘要

A method based on perturbation theory for describing ionization ion-atom collisions and an algorithm for statistical modeling of secondary electron trajectories is proposed for calculating the electron emission coefficient from a structureless solid target. The main contribution to the number of electrons emitted by the surface is made by electrons with energy Ee < 50 eV. Only a small target layer with a thickness of 20–40 Å determines the number of electrons emitted by the surface. If the target thickness exceeds this value, the electron emission coefficient does not depend on the target thickness. The change in the energy and charge of a fast ion in such a thin layer can be ignored, and the energy and charge of an ion emitted from the target can be used to estimate the number of secondary electrons.
Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques. 2025;(8):10–19
pages 10–19 views

Soft X-Ray Imaging Spectroscopy Based on Commercial Uncooled CMOS Detectors

Kuzin S., Kirichenko A., Pertsov A., Chervinsky V., Zolotov D., Rusakov A., Chkhalo N., Garakhin S., Reunov D., Bogachev S., Loboda I., Reva A.

摘要

Detectors based on CMOS matrices (CMOS is a complementary metal–oxide–semiconductor structure) are widely used to solve a wide range of problems that require imaging. In addition to their widespread use in conventional cameras, including mobile phones, today they are increasingly used in various fields of science and technology: dosimetry, imaging neutron and X-ray spectroscopy. On the basis of such devices, both X-ray microscopy devices and X-ray telescopes can be built, for example, for studying various astrophysical objects. The possibility of using two CMOS matrices from Sony IMX265LLR-C and IMX226CLJ-C for simultaneous imaging and spectral acquisition in the soft X-ray range is considered. It is shown that in the range from 1 to 22 keV, the detectors have a high energy resolution. A comparison of two matrices is carried out, and their features for use in recording radiation in various energy ranges are considered.
Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques. 2025;(8):20–28
pages 20–28 views

Surface Modification of Commercially Pure Titanium by Combining Plasma Electrolytic Carburizing, Polishing and Micro Arc Oxidation

Tambovskyi I., Kusmanova I., Kusmanov S., Mukhacheva T., Komarov A., Ilyinskaya M., Tambovskaya M., Meleshkin Y., Gaponov V., Morozov V., Tkachenko A., Grigoriev S.

摘要

The possibility of combining plasma electrolytic carburizing, polishing and micro-arc oxidation of commercially pure titanium to increase microhardness, wear resistance and quality of the modified surface has been demonstrated. Using X-ray structural analysis methods, structural and phase changes on the surface and in surface layers after processing were studied, solid titanium carbides TiC and Ti8C5 were detected in the modified layer, and the diffusion depth of carbon and oxygen was determined. The influence of each of the plasma electrolytic treatment methods on the tribological behavior in a friction pair with structural bearing steel was studied. The lowest surface friction coefficient is observed after carburizing at 900°C, polishing at 250 V and micro-arc oxidation at a current density of 12 A/dm2. It was determined that an increase in the loss of mass during friction and the volume of removed material after combined treatment is associated with an increase in the contact area in the tribocoupling, which is confirmed by an increase in the wear of the counterbody. The quality of the modified surface was assessed based on the geometry data on the surface of wear marks, the complex Kragelsky–Kombalov criterion was calculated, and the type of wear was determined. The Kragelsky–Kombalov criterion after plasma-electrolytic treatment decreases by 1.2–1.4 times, which indicates an increase in the bearing capacity of the rough profile of modified samples. The wear mechanism is fatigue wear during plastic deformation of the tribological conjugation.
Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques. 2025;(8):29–40
pages 29–40 views

Optical Spectra, Morphology and Photoconductivity of SnPc Thin Films Deposited at Different Temperatures

Travkin V., Koptyaev A., Luk’yanov A., Pakhomov G.

摘要

Thin films of tin (II) phthalocyanine (SnPc) have been thermally evaporated in vacuum on substrates at different temperature (Tg). Their transmission spectra in the UV, visible and near IR ranges have been measured. It is shown that a 100 nm thick SnPc films becomes almost panchromatic photoabsorbers: the “green gap” characteristic of porphyrinoids can narrow to the range 410–490 nm, and the long-wavelength edge of the Q-band can reach 1100–1200 nm, depending on the growth conditions. At Tg below room temperature, the films are X-ray-amorphous, and at Tg > 25°C, the triclinic polymorph accumulates. The structure of the films is always granular, but the size, shape and packing of grains largely depend on Tg. The specific conductivity of SnPc thin films has been measured in the dark and under continuous white light (solar simulator) or filtered near-infrared light. It is found that for SnPc films grown at elevated Tg, the photo-to-dark current ratio exceeds an order of magnitude under residual illumination at wavelengths longer than 1 µm.
Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques. 2025;(8):41–53
pages 41–53 views

The Effect of the Size of Ni Clusters Deposited on Alumina α-Al2O3(0001) upon the Adsorption Character of Nitric Oxide Molecules NO

Magkoev T., Men Y., Behjatmanesh-Ardakani R., Elahifard M., Ashkhotov O.

摘要

With the aid of combination of surface analysis techniques and theoretical calculations by density functional theory it is shown that the electronic and NO-adsorption properties of Ni nanoclusters deposited onto alumina α-Al2O3(0001) are notably dependent upon the cluster size. The properties of Ni clusters with a mean size lower than 2 nm are primarily determined by chemisorption bond polarized towards the oxide Ni–Al2O3. As a result, the Ni clusters acquire a net positive charge. The latter is manifested in that that the intramolecular bond of adsorbed NO strengthens compared to that of NO on the bulk Ni. As the size of the cluster grows, the chemisorption bond depolarizes due to the charge redistribution from the Ni–Al2O3 interface to the Ni-Ni lateral bonds. When the equivalent coverage of Ni exceeds 0.25 equivalent monoatomic layers, their NO-adsorption properties resemble those characteristic for bulk Ni. Such a size-dependence opens an opportunity for controlled tuning of electronic and adsorption properties of the oxide supported metal clusters, as well as the metal/oxide system as a whole.
Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques. 2025;(8):54–63
pages 54–63 views

In situ X-Ray Diffraction Studies of the Growing Thin Films of YSZ and GDC Using Synchrotron Radiation

Solovyev А., Shipilova А., Rabotkin S., Balash I., Shmakov A.

摘要

In this paper, the formation process and time evolution of the crystal structure of thin films of yttriastabilized zirconia ZrO2:Y2O3 (YSZ) and gadolinia-doped ceria Ce0.9Gd0.1O2, (GDC) were investigated. YSZ and GDC films for use as an electrolyte layer in microtubular solid oxide fuel cells were formed by reactive mid-frequency magnetron sputtering on WC-Co alloy substrates. The films were deposited in a vacuum setup specially designed for in situ X-ray diffraction studies of thin film growth using synchrotron radiation. It is shown that the texture of the formed films is determined by the substrate temperature. At a substrate temperature of 100‒187°C, YSZ and GDC films with a cubic crystal lattice are formed. Under such deposition conditions, YSZ films have a preferred orientation of (200), whereas for GDC films the preferred orientation changes from (111) to (220) during growth. To obtain YSZ and GDC films with a preferred orientation (111), which have the highest ionic conductivity, it is necessary to increase the mobility of adsorbed atoms by increasing the substrate temperature or applying a bias voltage to it. It is also shown that with the deposition parameters used, compressive residual stresses are formed in both films, which decrease slightly in amplitude with increasing film thickness due to the increase in grain size.
Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques. 2025;(8):64–74
pages 64–74 views

In situ High-Temperature Synchrotron X-Ray Studies of Microstructure And Phase Composition of Additively Fabricated Ti–6Al–4V/TiC Metal Matrix Composite

Panin A., Syrtanov M., Lobova T., Perevalova O., Kazachenok M.

摘要

The microstructure and phase composition of Ti–6Al–4V/TiC metal matrix composite samples obtained by wire-feed electron-beam additive manufacturing are investigated by X-ray diffraction analysis, optical, scanning and transmission electron microscopy. It is shown that the microstructure of the Ti–6Al–4V/TiC composite consists of primary β-grains containing α/α′-plates separated by interlayers of residual β- and α′′-phases. Irregularly shaped TiC carbide particles with sizes of 1–2 μm are distributed along the boundaries of the primary β-grains. The changes in the phase composition of the 3D-printed Ti–6Al–4V/TiC composites during heating from room temperature to 1100°C are investigated by X-ray diffraction using synchrotron radiation. The changes in the shape and position of the X-ray peaks of α/α′- and β-phases during heating and cooling are analyzed. It is shown that in the temperature range 700–800°C, there is a shift of the 110 peak of the β-phase towards large angles, as well as a change in its full width at half maximum associated with the formation and subsequent decomposition of the orthorhombic α′′-phase.
Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques. 2025;(8):75–84
pages 75–84 views

Relaxation of Plasmon Excitations in Solids

Afanas’ev V., Lobanova L.

摘要

The paper examines the influence of the decay process of plasmonic (Langmuir) excitations on secondary electron emission processes. An assessment of the lifetime of the plasmon excitations decay process is carried out. A connection is established between the relaxation process of plasmon excitations and electron-photon emission yield. The electron-ion plasma of a solid body, interacting with an electron beam whose energy substantially exceeds the Fermi energy, is considered based on quantum electrodynamics. It is shown that the quantum description of plasmons leads to the concept of the electromagnetic vacuum of longitudinal Langmuir waves. The vacuum of longitudinal waves significantly alters the dielectric permeability of the solid-body plasma, resulting in the broadening and shifting of peaks associated with energy losses of fast electrons scattered by the solid. The interaction of plasmons with the plasmonics vacuum leads to the relaxation of plasma excitations and the generation of longitudinal photons. The relaxation mechanism of plasmons presented in this work helps to explain a number of seemingly anomalous phenomena, namely the polarization of electron-photon emission observed at plasmonic frequencies and the features in the spectra of secondary electron emission at plasmonic energies observed during ion and electron bombardments. The paper presents a comparison of the spectra of electron-photon emission with the differential cross-sections of inelastic energy losses of fast electrons due to plasmon excitation. Possible practical applications of the phenomena observed during the relaxation of collective excitations of solid-body plasma are discussed.
Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques. 2025;(8):85–93
pages 85–93 views

Determination of the Phase Composition of Vanadium Oxide Nanofibers

Sharlaev A., Berezina O., Loginov D., Larionov D., Praslov N.

摘要

Using the electrospinning method, nanofibers consisting of vanadium oxide phase mixture were obtained. Their phase and quantitative compositions were determined by X-ray phase and full-profile analysis methods. It has been shown that the calculation of relative concentrations during the analysis of the phase composition using the Qualitative Analysis program gives results with a high error. For the accurate determination of the phase concentration of vanadium oxide multiphase samples, it is necessary to use a full-profile analysis or a quantitative analysis method (if possible).
Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques. 2025;(8):94–97
pages 94–97 views

Coherent X-Ray Radiation of Relativistic Electrons in a Composite Target

Noskov A., Blazhevich S., Bardakova I., Konovalenko A.

摘要

A dynamic theory of coherent X-ray radiation generated by a beam of relativistic electrons in a composite target “amorphous layer-vacuum-periodic layered medium” has been developed. A periodic layered medium consists of three different layers arranged periodically, with the layers located at an arbitrary angle to the target surface. Coherent X-ray radiation exits through the rear surface of the target, that is, radiation in a periodic layered medium occurs in the Laue scattering geometry. Within the framework of the two-wave approximation of the dynamic theory of diffraction, expressions describing the spectral-angular densities of parametric X-ray radiation (PXR) in a periodic layered medium and diffracted transition radiation (DTR) are obtained and studied.
Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques. 2025;(8):98–108
pages 98–108 views

Electronic Structure and Substructure of Epitaxial Tin Nanolayers on Silicon According to Synchrotron Studies

Boikov N., Chuvenkova O., Parinova E., Manyakin M., Kurganskii S., Makarova A., Smirnov D., Chumakov R., Lebedev A., Fateev K., Titova S., Turishchev S.

摘要

The specificity of the local atomic surrounding, the physicochemical state, and the electronic structure of five tin monolayers on a thin buffer layer of silicon formed epitaxially, and their transformation as a result of thermal annealing are studied in situ in the presented work. Using radiation from three synchrotron sources high-resolution surface-sensitive experimental methods, X-ray absorption near edge structure spectroscopy and X-ray photoelectron spectroscopy, were used as well as computer modeling. The possibility of oxygen atoms diffusion from tin to a buffer layer of silicon during storage of structures in laboratory conditions is shown. It is shown that during the formation of Sn/Si epitaxial nanolayers there are no interatomic interactions at the heterogeneous boundaries of the structure up to the possible formation of a tin-silicon solid solution and as a result no noticeable distortions of the electronic spectrum. However, high-temperature ultrahigh vacuum annealing causes a phase rearrangement of the surface layers of such a structure accompanied by the redistribution of oxygen atoms from tin atoms to silicon of the epitaxial buffer with the formation of the thin layer of SiO2. Within the thin tin-silicon transition layer of the studied structures and along its boundaries a complex bonds can be formed between tin, oxygen, and carbon atoms.
Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques. 2025;(8):109–124
pages 109–124 views

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