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Том 12, № 5 (2018)
Crystal Structure of the Intermetallic Thin-Film Cu–Sn Condensate
Makrushina A., Plotnikov V., Demyanov B., Makarov S.
PDF
(Eng)
Том 13, № 4 (2019)
Propagation of Waves and Particles Through Porous Structures (I)
Filippov G., Aleksandrov V., Lysova I., Stepanov A.
PDF
(Eng)
Том 13, № 1 (2019)
Long-Wave Oscillations of the Intensity of an Electron Beam Specularly Reflected from the Surface of a Growing Heteroepitaxial Film
Shkornyakov S.
PDF
(Eng)
Том 12, № 6 (2018)
Influence of the Substrate Type on the Surface Morphology of Cu2ZnSnSe4 Thin Films
Baraishuk S., Tkachenko T., Stanchik A., Gremenok V., Bashkirov S., Wiertel M., Budzynski M., Turovets A., Yakovenko Y.
PDF
(Eng)
Том 12, № 1 (2018)
Ion-Beam Synthesis of Ferromagnetic Films by the Implantation of Co+ Ions into Silicon
Chirkov V., Gumarov G., Petukhov V., Denisov A.
PDF
(Eng)
Том 13, № 6 (2019)
Study of Resonance Phenomena During Thin-Film Perforation upon the Passage of Multicharged Ions
Filippov G., Aleksandrov V., Stepanov A.
PDF
(Eng)
Том 13, № 1 (2019)
On the Synthesis of PdO−RuO2 Solid-Solution Thin Films by Thermal Oxidation and Investigation of Their Gas-Sensing Properties
Kuschev S., Ryabtsev S., Soldatenko S., Sinelnikov A., Dontsov A., Maksimenko A., Turaeva T.
PDF
(Eng)
Том 12, № 1 (2018)
Study of Thin Film Coatings by IR Phonon-Polariton Spectroscopy Methods
Vinogradov E., Yakovlev V.
PDF
(Eng)
Том 10, № 4 (2016)
Features of the electrical conductivity of Fe, Ni, Ti, and Pt nanoisland films: Hysteresis and ion-field processes
Tomilin S., Berzhansky V., Yanovsky A., Tomilina O.
PDF
(Eng)
Том 13, № 6 (2019)
Structural Surface Features of Tellurium-Doped Bismuth Films
Matveev D.
PDF
(Eng)
Том 13, № 3 (2019)
Mechanical Properties of Thin AlSiN Films, Studied by Nanoindentation, as a Thermal-Stability Criterion
Kuznetsova T., Zubar T., Lapitskaya V., Sudzilovskaya K., Chizhik S., Uglov V., Shymanski V., Kvasov N.
PDF
(Eng)
Том 10, № 4 (2016)
The effect of silicon-substrate orientation on the local piezoelectric characteristics of LiNbO3 films
Kiselev D., Zhukov R., Ksenich S., Kubasov I., Temirov A., Timushkin N., Bykov A., Malinkovich M., Shvartsman V., Lupascu D., Parkhomenko Y.
PDF
(Eng)
Том 13, № 5 (2019)
Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
Sybina Y., Borgardt N., Lazarenko P., Parsegova V., Prikhodko A., Sherchenkov A.
PDF
(Eng)
Том 13, № 3 (2019)
Electron Spectroscopy of Thin Nanocarbon Films
Nishchak O., Savchenko N., Streletsky O., Khvostov V., Zykova E.
PDF
(Eng)
Том 12, № 4 (2018)
XPS Study of Niobium and Niobium-Nitride Nanofilms
Lubenchenko A., Batrakov A., Shurkaeva I., Pavolotsky A., Krause S., Ivanov D., Lubenchenko O.
PDF
(Eng)
Том 11, № 5 (2017)
Spontaneous polarization of finely disperse dielectrics with surface donor centers
Kharlamov V.
PDF
(Eng)
Том 13, № 5 (2019)
Diagnostics of the Elemental Composition of PZT Films on Platinum by X-Ray Microprobe Analysis
Beshenkov V., Znamenskii A., Marchenko V., Nekrasov A.
PDF
(Eng)
Том 13, № 2 (2019)
PLD Grown SiC Thin Films on Al2O3: Morphology and Structure
Kargin N., Gusev A., Ryndya S., Timofeev A., Grekhov M., Siglovaya N., Antonenko S.
PDF
(Eng)
Том 13, № 1 (2019)
Study of Local Charge Accumulation in ZrO2(Y) Films with Au Nanoparticles by Kelvin Probe Force Microsсopy
Koryazhkina M., Filatov D., Antonov I., Ryabova M., Dunaevskii M.
PDF
(Eng)
Том 12, № 2 (2018)
Influence of Oxygen Vacancies on the Magnetic Properties of Zn1 – xCoxOy Films
Lotin A., Kuz’mina A., Novodvorsky O., Parshina L., Mikhalevsky V., Khramova O., Cherebilo E., Perov N., Makarova L., Shneider A., Kuz’min M.
PDF
(Eng)
Том 11, № 3 (2017)
Quantum size effect observed during the small-angle reflection of an electron beam incident onto a single-crystal film with allowance for the average internal lattice potential
Shkornyakov S.
PDF
(Eng)
Том 13, № 5 (2019)
Determination of the Thickness of Thin Films Based on Scanning Electron Microscopy and Energy Dispersive X-Ray Analysis
Sokolov S., Milovanov R., Sidorov L.
PDF
(Eng)
Том 12, № 2 (2018)
Vanadium- and Titanium Dioxide-Based Memristors Fabricated via Pulsed Laser Deposition
Novodvorsky O., Parshina L., Lotin A., Mikhalevsky V., Khramova O., Cherebylo E., Panchenko V.
PDF
(Eng)
Том 11, № 1 (2017)
Microstructure, phase analysis and dielectric response of thin Pb(Zr,Ti)O3 films at the morphotropic phase boundary
Pronin I., Pronin V., Kanareikin A., Dolgintsev D., Kaptelov E., Senkevich S.
PDF
(Eng)
Том 10, № 2 (2016)
Kinetics of the formation of oxide nanostructures on n-Si in the potentiostatic mode of water anodization
Orlov A., Yavtushenko I., Makhmud-Akhunov M., Solovyev A.
PDF
(Eng)
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