Study of Local Charge Accumulation in ZrO2(Y) Films with Au Nanoparticles by Kelvin Probe Force Microsсopy
- Authors: Koryazhkina M.N.1, Filatov D.O.1, Antonov I.N.1, Ryabova M.A.1, Dunaevskii M.S.2
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Affiliations:
- Lobachevsky Nizhny Novgorod State University
- Ioffe Physical–Technical Institute, Russian Academy of Sciences
- Issue: Vol 13, No 1 (2019)
- Pages: 30-35
- Section: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/196198
- DOI: https://doi.org/10.1134/S1027451019010105
- ID: 196198
Cite item
Abstract
The time dynamics of the spatial distribution of electrons locally injected from the probe of an atomic force microscope into thin (less than 10 nm) ZrO2(Y) films with embedded Au nanoparticles on Si substrates is studied via Kelvin probe force microscopy. The profiles of the film surface potential induced by the injection of a countable number (several tens) of electrons into Au nanoparticles, as a function of the time elapsed after injection, are measured and analyzed.
About the authors
M. N. Koryazhkina
Lobachevsky Nizhny Novgorod State University
Author for correspondence.
Email: mahavenok@mail.ru
Russian Federation, Nizhny Novgorod, 603950
D. O. Filatov
Lobachevsky Nizhny Novgorod State University
Email: mahavenok@mail.ru
Russian Federation, Nizhny Novgorod, 603950
I. N. Antonov
Lobachevsky Nizhny Novgorod State University
Email: mahavenok@mail.ru
Russian Federation, Nizhny Novgorod, 603950
M. A. Ryabova
Lobachevsky Nizhny Novgorod State University
Email: mahavenok@mail.ru
Russian Federation, Nizhny Novgorod, 603950
M. S. Dunaevskii
Ioffe Physical–Technical Institute, Russian Academy of Sciences
Email: mahavenok@mail.ru
Russian Federation, St. Petersburg, 194021
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