Study of Local Charge Accumulation in ZrO2(Y) Films with Au Nanoparticles by Kelvin Probe Force Microsсopy


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Abstract

The time dynamics of the spatial distribution of electrons locally injected from the probe of an atomic force microscope into thin (less than 10 nm) ZrO2(Y) films with embedded Au nanoparticles on Si substrates is studied via Kelvin probe force microscopy. The profiles of the film surface potential induced by the injection of a countable number (several tens) of electrons into Au nanoparticles, as a function of the time elapsed after injection, are measured and analyzed.

About the authors

M. N. Koryazhkina

Lobachevsky Nizhny Novgorod State University

Author for correspondence.
Email: mahavenok@mail.ru
Russian Federation, Nizhny Novgorod, 603950

D. O. Filatov

Lobachevsky Nizhny Novgorod State University

Email: mahavenok@mail.ru
Russian Federation, Nizhny Novgorod, 603950

I. N. Antonov

Lobachevsky Nizhny Novgorod State University

Email: mahavenok@mail.ru
Russian Federation, Nizhny Novgorod, 603950

M. A. Ryabova

Lobachevsky Nizhny Novgorod State University

Email: mahavenok@mail.ru
Russian Federation, Nizhny Novgorod, 603950

M. S. Dunaevskii

Ioffe Physical–Technical Institute, Russian Academy of Sciences

Email: mahavenok@mail.ru
Russian Federation, St. Petersburg, 194021

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