Study of Resonance Phenomena During Thin-Film Perforation upon the Passage of Multicharged Ions
- Авторлар: Filippov G.1, Aleksandrov V.2, Stepanov A.3
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Мекемелер:
- Moscow State Open University Cheboksary Polytechnic Institute
- Ulianov Chuvash State University
- Chuvash State Agricultural Academy
- Шығарылым: Том 13, № 6 (2019)
- Беттер: 1280-1283
- Бөлім: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/196586
- DOI: https://doi.org/10.1134/S1027451019060302
- ID: 196586
Дәйексөз келтіру
Аннотация
The process of the perforation of a nanometer-thick film during passage of the wave packet of a multicharged ion is studied. It is shown that the resonant behavior of vibrations of the disk released from the film has a significant effect on the perforation process. The resonance mechanism is based on the “push-pull” process. A model of the strength of the polarization interaction between the film and the wave packet of the particle is proposed. The model makes it possible to estimate the threshold value of the force required to form a pore during the passage of a multicharged ion through the film.
Негізгі сөздер
Авторлар туралы
G. Filippov
Moscow State Open University Cheboksary Polytechnic Institute
Хат алмасуға жауапты Автор.
Email: filippov38-gm@yandex.ru
Ресей, Cheboksary, 428000
V. Aleksandrov
Ulianov Chuvash State University
Email: filippov38-gm@yandex.ru
Ресей, Cheboksary, 428000
A. Stepanov
Chuvash State Agricultural Academy
Email: filippov38-gm@yandex.ru
Ресей, Cheboksary, 428000