Study of Photodetectors with Schottky Barriers Based on the IrSi–Si Contact

A significant increase in the fill factor of Schottky matrices is achieved by reading the charge accu-mulated in the Schottky diode not by using charge-coupled device (CCD) registers but by injecting it into the signal bus, similarly to charge-injected device (CID) structures on narrow-gap semiconductors. In this case, the multielement matrix contains horizontal buses to poll the elements of the selected row, vertical signal lines, and a metal–oxide–semiconductor (MOS) switch for connecting the polled column and the matrix of photosensitive elements, each consisting of a photosensitive Schottky diode and a MOS switch.