User

Username
Password
Remember me
Forgot password?	Register

Keywords Förster effect bipolar transistor charge qubit diagnostics dissociation etching fluorine atoms ionization kinetics magnetron sputtering mechanical stress mechanism memristor modeling molecular beam epitaxy plasma polymerization quantum dot resistive switching silicon specific power

Article Tools

Metrics

Search

Search

Search Scope All Authors Title Abstract Index terms Full Text

Browse

• By Issue
• By Author
• By Title
• Other Journals

Current Issue

Vol 54, No 6 (2025)

Notifications

• View
• Subscribe