Scanning Thermal Imaging Device Based on a Domestic Photodetector Device
- Авторлар: Kremis I.1, Kalinin V.1, Fedorinin V.1, Korsakov Y.1, Shatunov K.1
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Мекемелер:
- Technological and Design Institute of Applied Microelectronics (Branch of Rzhanov Institute of Semiconductor Physics), Siberian Branch
- Шығарылым: Том 63, № 3 (2018)
- Беттер: 292-295
- Бөлім: Articles from the Russian Journal Prikladnaya Fizika
- URL: https://journals.rcsi.science/1064-2269/article/view/199599
- DOI: https://doi.org/10.1134/S1064226918030117
- ID: 199599
Дәйексөз келтіру
Аннотация
The results of the development of a thermal imaging device based on the FEM10M photodetector produced by the Orion Research and Production Association are presented. As a result of the implementation of measures for improvement of the TPK-Z thermal imaging camera so as to comply with a domestic photodetector, the TPK-ZR thermal imaging device based on a domestic multirow array was developed, tuned, and tested. The minimum allowed temperature difference (MATD) and noise equivalent temperature difference (NETD) characteristics of the device are at least as good as the corresponding characteristics of a thermal imager using a foreign photodetector. The complex of image processing algorithms used in the TPK-ZR device makes it possible to obtain thermal images whose quality is not worse then the quality of the images obtained with the TPK-Z device. Further development of the obtained result can be implementation of a series of measures aimed at achieving full automation of calibration processes in the thermal imager.
Негізгі сөздер
Авторлар туралы
I. Kremis
Technological and Design Institute of Applied Microelectronics (Branch of Rzhanov Institute of Semiconductor Physics), Siberian Branch
Хат алмасуға жауапты Автор.
Email: igor21738@ngs.ru
Ресей, Novosibirsk, 630090
V. Kalinin
Technological and Design Institute of Applied Microelectronics (Branch of Rzhanov Institute of Semiconductor Physics), Siberian Branch
Email: igor21738@ngs.ru
Ресей, Novosibirsk, 630090
V. Fedorinin
Technological and Design Institute of Applied Microelectronics (Branch of Rzhanov Institute of Semiconductor Physics), Siberian Branch
Email: igor21738@ngs.ru
Ресей, Novosibirsk, 630090
Yu. Korsakov
Technological and Design Institute of Applied Microelectronics (Branch of Rzhanov Institute of Semiconductor Physics), Siberian Branch
Email: igor21738@ngs.ru
Ресей, Novosibirsk, 630090
K. Shatunov
Technological and Design Institute of Applied Microelectronics (Branch of Rzhanov Institute of Semiconductor Physics), Siberian Branch
Email: igor21738@ngs.ru
Ресей, Novosibirsk, 630090