Автор туралы ақпарат

Seregin, A. Yu.

Шығарылым	Бөлім	Атауы	Файл
Том 62, № 3 (2017)	Diffraction and Scattering of Ionizing Radiations	X-ray analysis of multilayer In_0.52Al_0.48As/In_0.53Ga_0.47As/In_0.52Al_0.48As HEMT heterostructures with InAs nanoinsert in quantum well
Том 62, № 4 (2017)	Surface, Thin Films	Modification of the Langmuir–Schaefer method for fabrication of ordered protein films
Том 63, № 5 (2018)	Diffraction and Scattering of Ionizing Radiations	Fabrication of Multilayer Films on the Basis of Lysozyme Protein and Precipitant (Iodide and Potassium) Ions on a Silicon Substrate by the Modified Langmuir–Schaefer Method
Том 64, № 1 (2019)	Diffraction and Scattering of Ionizing Radiations	Experimental Study of Two-Beam X-Ray Diffractometry Using Synchrotron Radiation
Том 64, № 3 (2019)	Crystallographic Methods in Humanitarian Sciences	X-Ray, Synchrotron and Mass-Spectrometric Methods for the Study of Ceramic Objects of Cultural Heritage
Том 64, № 4 (2019)	Diffraction and Scattering of Ionizing Radiations	Experimental and Theoretical Study of the Triple-Crystal High-Resolution X-Ray Diffraction Scheme in Reciprocal Space Mapping Technique