Resistive switching in mesoscopic heterostructures based on Nd2–xCexCuO4–y epitaxial films


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Reversible and stable bistable resistive switching were observed in planar-type junctions Nd2–xCexCuO4–y/Nd2–xCexO1.75/Ag. It was shown that current transport in such junctions has a diode character with Schottky-like barriers in highly doped semiconductors. It was revealed that the key factor for switching is the presence of the second phase Nd2–xCexO1.75, deficient in oxygen, epitaxially germinated at the Nd2–xCexCuO4–y surface.

作者简介

N. Tulina

Institute of Solid State Physics

编辑信件的主要联系方式.
Email: tulina@issp.ac.ru
俄罗斯联邦, Chernogolovka, Moscow oblast, 142432

A. Ivanov

National Research Nuclear University (MEPhI)

Email: tulina@issp.ac.ru
俄罗斯联邦, Moscow, 119991

A. Rossolenko

Institute of Solid State Physics

Email: tulina@issp.ac.ru
俄罗斯联邦, Chernogolovka, Moscow oblast, 142432

I. Shmytko

Institute of Solid State Physics

Email: tulina@issp.ac.ru
俄罗斯联邦, Chernogolovka, Moscow oblast, 142432

A. Ionov

Institute of Solid State Physics

Email: tulina@issp.ac.ru
俄罗斯联邦, Chernogolovka, Moscow oblast, 142432

R. Mozhchil’

Institute of Solid State Physics; National Research Nuclear University (MEPhI)

Email: tulina@issp.ac.ru
俄罗斯联邦, Chernogolovka, Moscow oblast, 142432; Moscow, 119991

I. Borisenko

Institute of Microelectronics Technology and High-Purity Materials

Email: tulina@issp.ac.ru
俄罗斯联邦, Chernogolovka, Moscow oblast, 142432


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