Practical aspects of producing MIS structures with good prospects using atomic layer deposition technology


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The physical and chemical foundations of the atomic layer deposition (ALD) process, the advantages of ALD technology, and possible applications for further miniaturizing and improving the performance of semiconductor devices are considered. The results of the atomic layer deposition of the advanced nanoelectronic material hafnium oxide are discussed. The dielectric characteristics’ measurements and microstructure analysis results are given.

作者简介

A. Aliabev

Peter the Great St. Petersburg Polytechnic University

编辑信件的主要联系方式.
Email: alyabjev_au@mail.ru
俄罗斯联邦, St. Petersburg

A. Korotkov

Peter the Great St. Petersburg Polytechnic University

Email: alyabjev_au@mail.ru
俄罗斯联邦, St. Petersburg


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