Practical aspects of producing MIS structures with good prospects using atomic layer deposition technology
- Авторлар: Aliabev A.J.1, Korotkov A.S.1
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Мекемелер:
- Peter the Great St. Petersburg Polytechnic University
- Шығарылым: Том 45, № 4 (2016)
- Беттер: 229-236
- Бөлім: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/185666
- DOI: https://doi.org/10.1134/S1063739716040028
- ID: 185666
Дәйексөз келтіру
Аннотация
The physical and chemical foundations of the atomic layer deposition (ALD) process, the advantages of ALD technology, and possible applications for further miniaturizing and improving the performance of semiconductor devices are considered. The results of the atomic layer deposition of the advanced nanoelectronic material hafnium oxide are discussed. The dielectric characteristics’ measurements and microstructure analysis results are given.
Авторлар туралы
A. Aliabev
Peter the Great St. Petersburg Polytechnic University
Хат алмасуға жауапты Автор.
Email: alyabjev_au@mail.ru
Ресей, St. Petersburg
A. Korotkov
Peter the Great St. Petersburg Polytechnic University
Email: alyabjev_au@mail.ru
Ресей, St. Petersburg
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