Email this article Functional testing of digital signal processors in radiation experiments
- Authors: Marfin V.A.1,2, Nekrasov P.V.1,2, Kalashnikov O.A.1,2, Nikiforov A.Y.1,2
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Affiliations:
- National Research Nuclear University MEPhI
- Specialized Electronic Systems (SPELS)
- Issue: Vol 46, No 3 (2017)
- Pages: 171-179
- Section: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/186331
- DOI: https://doi.org/10.1134/S1063739717030052
- ID: 186331
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Abstract
This paper analyzes the specifics of digital signal processors’ (DSPs) radiation-induced failures. The general methodology, as well as the hardware and software, for the functional testing (FT) of DSPs in radiation experiments is developed and implemented. The experimental results are presented to demonstrate the effectiveness of the solutions proposed.
About the authors
V. A. Marfin
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Author for correspondence.
Email: vamar@spels.ru
Russian Federation, Moscow, 115409; Moscow, 115409
P. V. Nekrasov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
Russian Federation, Moscow, 115409; Moscow, 115409
O. A. Kalashnikov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
Russian Federation, Moscow, 115409; Moscow, 115409
A. Yu. Nikiforov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
Russian Federation, Moscow, 115409; Moscow, 115409
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