Мақаланы E-mail арқылы жіберу Functional testing of digital signal processors in radiation experiments
- Авторлар: Marfin V.A.1,2, Nekrasov P.V.1,2, Kalashnikov O.A.1,2, Nikiforov A.Y.1,2
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Мекемелер:
- National Research Nuclear University MEPhI
- Specialized Electronic Systems (SPELS)
- Шығарылым: Том 46, № 3 (2017)
- Беттер: 171-179
- Бөлім: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/186331
- DOI: https://doi.org/10.1134/S1063739717030052
- ID: 186331
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Рұқсат берілді
Тек жазылушылар үшін
Аннотация
This paper analyzes the specifics of digital signal processors’ (DSPs) radiation-induced failures. The general methodology, as well as the hardware and software, for the functional testing (FT) of DSPs in radiation experiments is developed and implemented. The experimental results are presented to demonstrate the effectiveness of the solutions proposed.
Авторлар туралы
V. Marfin
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Хат алмасуға жауапты Автор.
Email: vamar@spels.ru
Ресей, Moscow, 115409; Moscow, 115409
P. Nekrasov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
Ресей, Moscow, 115409; Moscow, 115409
O. Kalashnikov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
Ресей, Moscow, 115409; Moscow, 115409
A. Nikiforov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
Ресей, Moscow, 115409; Moscow, 115409
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