Enviar artigo por via de e-mail Functional testing of digital signal processors in radiation experiments
- Autores: Marfin V.A.1,2, Nekrasov P.V.1,2, Kalashnikov O.A.1,2, Nikiforov A.Y.1,2
-
Afiliações:
- National Research Nuclear University MEPhI
- Specialized Electronic Systems (SPELS)
- Edição: Volume 46, Nº 3 (2017)
- Páginas: 171-179
- Seção: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/186331
- DOI: https://doi.org/10.1134/S1063739717030052
- ID: 186331
Citar
Acesso aberto
Acesso está concedido
Somente assinantes
Resumo
This paper analyzes the specifics of digital signal processors’ (DSPs) radiation-induced failures. The general methodology, as well as the hardware and software, for the functional testing (FT) of DSPs in radiation experiments is developed and implemented. The experimental results are presented to demonstrate the effectiveness of the solutions proposed.
Sobre autores
V. Marfin
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Autor responsável pela correspondência
Email: vamar@spels.ru
Rússia, Moscow, 115409; Moscow, 115409
P. Nekrasov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
Rússia, Moscow, 115409; Moscow, 115409
O. Kalashnikov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
Rússia, Moscow, 115409; Moscow, 115409
A. Nikiforov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
Rússia, Moscow, 115409; Moscow, 115409
Arquivos suplementares
