电邮这篇文章 Functional testing of digital signal processors in radiation experiments
- 作者: Marfin V.A.1,2, Nekrasov P.V.1,2, Kalashnikov O.A.1,2, Nikiforov A.Y.1,2
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隶属关系:
- National Research Nuclear University MEPhI
- Specialized Electronic Systems (SPELS)
- 期: 卷 46, 编号 3 (2017)
- 页面: 171-179
- 栏目: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/186331
- DOI: https://doi.org/10.1134/S1063739717030052
- ID: 186331
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详细
This paper analyzes the specifics of digital signal processors’ (DSPs) radiation-induced failures. The general methodology, as well as the hardware and software, for the functional testing (FT) of DSPs in radiation experiments is developed and implemented. The experimental results are presented to demonstrate the effectiveness of the solutions proposed.
作者简介
V. Marfin
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
编辑信件的主要联系方式.
Email: vamar@spels.ru
俄罗斯联邦, Moscow, 115409; Moscow, 115409
P. Nekrasov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
俄罗斯联邦, Moscow, 115409; Moscow, 115409
O. Kalashnikov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
俄罗斯联邦, Moscow, 115409; Moscow, 115409
A. Nikiforov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
俄罗斯联邦, Moscow, 115409; Moscow, 115409
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