Functional testing of digital signal processors in radiation experiments
- Авторы: Marfin V.A.1,2, Nekrasov P.V.1,2, Kalashnikov O.A.1,2, Nikiforov A.Y.1,2
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Учреждения:
- National Research Nuclear University MEPhI
- Specialized Electronic Systems (SPELS)
- Выпуск: Том 46, № 3 (2017)
- Страницы: 171-179
- Раздел: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/186331
- DOI: https://doi.org/10.1134/S1063739717030052
- ID: 186331
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Аннотация
This paper analyzes the specifics of digital signal processors’ (DSPs) radiation-induced failures. The general methodology, as well as the hardware and software, for the functional testing (FT) of DSPs in radiation experiments is developed and implemented. The experimental results are presented to demonstrate the effectiveness of the solutions proposed.
Об авторах
V. Marfin
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Автор, ответственный за переписку.
Email: vamar@spels.ru
Россия, Moscow, 115409; Moscow, 115409
P. Nekrasov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
Россия, Moscow, 115409; Moscow, 115409
O. Kalashnikov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
Россия, Moscow, 115409; Moscow, 115409
A. Nikiforov
National Research Nuclear University MEPhI; Specialized Electronic Systems (SPELS)
Email: vamar@spels.ru
Россия, Moscow, 115409; Moscow, 115409
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