Stability analysis of monolithic integrated circuit of microwave signal converter to the influence of special factors


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Abstract

The research results of the resistance of signal converters with the operating frequency of 57–64 GHz, manufactured at the Institute of Ultrahigh Frequency Semiconductor Electronics on AlGaN/GaN/Al2O3 heterostructures to the action of special factors such as neutron and gamma radiation are presented. The results of evaluation of the long-term stability of the signal converters at high temperature are also discussed. The possible physical mechanisms of the changing characteristics are considered.

About the authors

K. A. Kagirina

Institute of Ultrahigh Frequency Semiconductor Electronics

Author for correspondence.
Email: kagirina@gmail.com
Russian Federation, Moscow, 117105

Yu. V. Fedorov

Institute of Ultrahigh Frequency Semiconductor Electronics

Email: kagirina@gmail.com
Russian Federation, Moscow, 117105

D. V. Lavrukhin

Institute of Ultrahigh Frequency Semiconductor Electronics

Email: kagirina@gmail.com
Russian Federation, Moscow, 117105

S. A. Gamkrelidze

Institute of Ultrahigh Frequency Semiconductor Electronics

Email: kagirina@gmail.com
Russian Federation, Moscow, 117105

D. L. Gnatyuk

Institute of Ultrahigh Frequency Semiconductor Electronics

Email: kagirina@gmail.com
Russian Federation, Moscow, 117105

A. V. Zuev

Institute of Ultrahigh Frequency Semiconductor Electronics

Email: kagirina@gmail.com
Russian Federation, Moscow, 117105

O. A. Ruban

Institute of Ultrahigh Frequency Semiconductor Electronics

Email: kagirina@gmail.com
Russian Federation, Moscow, 117105

D. V. Gromov

National Research Nuclear University “MEPhI,”

Email: kagirina@gmail.com
Russian Federation, Moscow, 115409


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