Error of sample preparation in pressing emitters for X-ray fluorescence analysis


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When determining element concentrations in geological samples by X-ray fluorescence spectrometry using emitters obtained by pressing tablets from powder samples, we revealed the effect of a significant difference in line intensities of characteristic long-wavelength emission (ΔIi) from opposite sides of the emitter. The effects of compacting pressure, mass of emitter, and its surface area on ΔIi were investigated. It was shown that the account of this effect can reduce the error of sample preparation in using compacting pressures lower than 20 t.

作者简介

T. Kuz’mina

Vernadsky Institute of Geochemistry and Analytical Chemistry

编辑信件的主要联系方式.
Email: kuzminatg@inbox.ru
俄罗斯联邦, Moscow, 119991

M. Troneva

Vernadsky Institute of Geochemistry and Analytical Chemistry

Email: kuzminatg@inbox.ru
俄罗斯联邦, Moscow, 119991

N. Kononkova

Vernadsky Institute of Geochemistry and Analytical Chemistry

Email: kuzminatg@inbox.ru
俄罗斯联邦, Moscow, 119991

T. Romashova

Vernadsky Institute of Geochemistry and Analytical Chemistry

Email: kuzminatg@inbox.ru
俄罗斯联邦, Moscow, 119991


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