Error of sample preparation in pressing emitters for X-ray fluorescence analysis
- 作者: Kuz’mina T.1, Troneva M.1, Kononkova N.1, Romashova T.1
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隶属关系:
- Vernadsky Institute of Geochemistry and Analytical Chemistry
- 期: 卷 72, 编号 3 (2017)
- 页面: 272-278
- 栏目: Articles
- URL: https://journals.rcsi.science/1061-9348/article/view/182335
- DOI: https://doi.org/10.1134/S1061934817030066
- ID: 182335
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详细
When determining element concentrations in geological samples by X-ray fluorescence spectrometry using emitters obtained by pressing tablets from powder samples, we revealed the effect of a significant difference in line intensities of characteristic long-wavelength emission (ΔIi) from opposite sides of the emitter. The effects of compacting pressure, mass of emitter, and its surface area on ΔIi were investigated. It was shown that the account of this effect can reduce the error of sample preparation in using compacting pressures lower than 20 t.
作者简介
T. Kuz’mina
Vernadsky Institute of Geochemistry and Analytical Chemistry
编辑信件的主要联系方式.
Email: kuzminatg@inbox.ru
俄罗斯联邦, Moscow, 119991
M. Troneva
Vernadsky Institute of Geochemistry and Analytical Chemistry
Email: kuzminatg@inbox.ru
俄罗斯联邦, Moscow, 119991
N. Kononkova
Vernadsky Institute of Geochemistry and Analytical Chemistry
Email: kuzminatg@inbox.ru
俄罗斯联邦, Moscow, 119991
T. Romashova
Vernadsky Institute of Geochemistry and Analytical Chemistry
Email: kuzminatg@inbox.ru
俄罗斯联邦, Moscow, 119991