Error of sample preparation in pressing emitters for X-ray fluorescence analysis
- Авторы: Kuz’mina T.G.1, Troneva M.A.1, Kononkova N.N.1, Romashova T.V.1
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Учреждения:
- Vernadsky Institute of Geochemistry and Analytical Chemistry
- Выпуск: Том 72, № 3 (2017)
- Страницы: 272-278
- Раздел: Articles
- URL: https://journals.rcsi.science/1061-9348/article/view/182335
- DOI: https://doi.org/10.1134/S1061934817030066
- ID: 182335
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Аннотация
When determining element concentrations in geological samples by X-ray fluorescence spectrometry using emitters obtained by pressing tablets from powder samples, we revealed the effect of a significant difference in line intensities of characteristic long-wavelength emission (ΔIi) from opposite sides of the emitter. The effects of compacting pressure, mass of emitter, and its surface area on ΔIi were investigated. It was shown that the account of this effect can reduce the error of sample preparation in using compacting pressures lower than 20 t.
Об авторах
T. Kuz’mina
Vernadsky Institute of Geochemistry and Analytical Chemistry
Автор, ответственный за переписку.
Email: kuzminatg@inbox.ru
Россия, Moscow, 119991
M. Troneva
Vernadsky Institute of Geochemistry and Analytical Chemistry
Email: kuzminatg@inbox.ru
Россия, Moscow, 119991
N. Kononkova
Vernadsky Institute of Geochemistry and Analytical Chemistry
Email: kuzminatg@inbox.ru
Россия, Moscow, 119991
T. Romashova
Vernadsky Institute of Geochemistry and Analytical Chemistry
Email: kuzminatg@inbox.ru
Россия, Moscow, 119991
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