Error of sample preparation in pressing emitters for X-ray fluorescence analysis
- Авторлар: Kuz’mina T.1, Troneva M.1, Kononkova N.1, Romashova T.1
-
Мекемелер:
- Vernadsky Institute of Geochemistry and Analytical Chemistry
- Шығарылым: Том 72, № 3 (2017)
- Беттер: 272-278
- Бөлім: Articles
- URL: https://journals.rcsi.science/1061-9348/article/view/182335
- DOI: https://doi.org/10.1134/S1061934817030066
- ID: 182335
Дәйексөз келтіру
Аннотация
When determining element concentrations in geological samples by X-ray fluorescence spectrometry using emitters obtained by pressing tablets from powder samples, we revealed the effect of a significant difference in line intensities of characteristic long-wavelength emission (ΔIi) from opposite sides of the emitter. The effects of compacting pressure, mass of emitter, and its surface area on ΔIi were investigated. It was shown that the account of this effect can reduce the error of sample preparation in using compacting pressures lower than 20 t.
Авторлар туралы
T. Kuz’mina
Vernadsky Institute of Geochemistry and Analytical Chemistry
Хат алмасуға жауапты Автор.
Email: kuzminatg@inbox.ru
Ресей, Moscow, 119991
M. Troneva
Vernadsky Institute of Geochemistry and Analytical Chemistry
Email: kuzminatg@inbox.ru
Ресей, Moscow, 119991
N. Kononkova
Vernadsky Institute of Geochemistry and Analytical Chemistry
Email: kuzminatg@inbox.ru
Ресей, Moscow, 119991
T. Romashova
Vernadsky Institute of Geochemistry and Analytical Chemistry
Email: kuzminatg@inbox.ru
Ресей, Moscow, 119991