Error of sample preparation in pressing emitters for X-ray fluorescence analysis

Abstract

When determining element concentrations in geological samples by X-ray fluorescence spectrometry using emitters obtained by pressing tablets from powder samples, we revealed the effect of a significant difference in line intensities of characteristic long-wavelength emission (ΔI_i) from opposite sides of the emitter. The effects of compacting pressure, mass of emitter, and its surface area on ΔI_i were investigated. It was shown that the account of this effect can reduce the error of sample preparation in using compacting pressures lower than 20 t.