X-ray fluorescence determination of the surface density of thin chromium and iron films using reference samples of elements with close atomic numbers


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In X-ray fluorescence determinations of the surface density of thin chromium and iron films, we studied the possibility of using an approach based on the application of reference samples of elements with close atomic numbers. It was shown that the proposed diagnostic approach ensures the determination of the surface density of films with rather high precision.

作者简介

N. Mashin

Nizhny Novgorod State University

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Email: mashin@chem.unn.ru
俄罗斯联邦, pr. Gagarina 23, building 5, Nizhny Novgorod, 603950

E. Chernyaeva

Nizhny Novgorod State University

Email: mashin@chem.unn.ru
俄罗斯联邦, pr. Gagarina 23, building 5, Nizhny Novgorod, 603950

A. Tumanova

Nizhny Novgorod State University

Email: mashin@chem.unn.ru
俄罗斯联邦, pr. Gagarina 23, building 5, Nizhny Novgorod, 603950

A. Ershov

Nizhny Novgorod State University

Email: mashin@chem.unn.ru
俄罗斯联邦, pr. Gagarina 23, building 5, Nizhny Novgorod, 603950


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