Email this article X-ray fluorescence determination of the surface density of thin chromium and iron films using reference samples of elements with close atomic numbers
- Authors: Mashin N.I.1, Chernyaeva E.A.1, Tumanova A.N.1, Ershov A.A.1
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Affiliations:
- Nizhny Novgorod State University
- Issue: Vol 71, No 6 (2016)
- Pages: 569-572
- Section: Articles
- URL: https://journals.rcsi.science/1061-9348/article/view/181764
- DOI: https://doi.org/10.1134/S1061934816060095
- ID: 181764
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Abstract
In X-ray fluorescence determinations of the surface density of thin chromium and iron films, we studied the possibility of using an approach based on the application of reference samples of elements with close atomic numbers. It was shown that the proposed diagnostic approach ensures the determination of the surface density of films with rather high precision.
About the authors
N. I. Mashin
Nizhny Novgorod State University
Author for correspondence.
Email: mashin@chem.unn.ru
Russian Federation, pr. Gagarina 23, building 5, Nizhny Novgorod, 603950
E. A. Chernyaeva
Nizhny Novgorod State University
Email: mashin@chem.unn.ru
Russian Federation, pr. Gagarina 23, building 5, Nizhny Novgorod, 603950
A. N. Tumanova
Nizhny Novgorod State University
Email: mashin@chem.unn.ru
Russian Federation, pr. Gagarina 23, building 5, Nizhny Novgorod, 603950
A. A. Ershov
Nizhny Novgorod State University
Email: mashin@chem.unn.ru
Russian Federation, pr. Gagarina 23, building 5, Nizhny Novgorod, 603950
