X-ray fluorescence determination of the surface density of thin chromium and iron films using reference samples of elements with close atomic numbers
- Авторы: Mashin N.I.1, Chernyaeva E.A.1, Tumanova A.N.1, Ershov A.A.1
-
Учреждения:
- Nizhny Novgorod State University
- Выпуск: Том 71, № 6 (2016)
- Страницы: 569-572
- Раздел: Articles
- URL: https://journals.rcsi.science/1061-9348/article/view/181764
- DOI: https://doi.org/10.1134/S1061934816060095
- ID: 181764
Цитировать
Аннотация
In X-ray fluorescence determinations of the surface density of thin chromium and iron films, we studied the possibility of using an approach based on the application of reference samples of elements with close atomic numbers. It was shown that the proposed diagnostic approach ensures the determination of the surface density of films with rather high precision.
Об авторах
N. Mashin
Nizhny Novgorod State University
Автор, ответственный за переписку.
Email: mashin@chem.unn.ru
Россия, pr. Gagarina 23, building 5, Nizhny Novgorod, 603950
E. Chernyaeva
Nizhny Novgorod State University
Email: mashin@chem.unn.ru
Россия, pr. Gagarina 23, building 5, Nizhny Novgorod, 603950
A. Tumanova
Nizhny Novgorod State University
Email: mashin@chem.unn.ru
Россия, pr. Gagarina 23, building 5, Nizhny Novgorod, 603950
A. Ershov
Nizhny Novgorod State University
Email: mashin@chem.unn.ru
Россия, pr. Gagarina 23, building 5, Nizhny Novgorod, 603950
Дополнительные файлы
