Atomic Force Microscopy for Studies of Molecular Layering Products
- Авторлар: Sosnov E.A.1, Kochetkova A.S.1
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Мекемелер:
- Saint-Petersburg State Institute of Technology
- Шығарылым: Том 12, № 6 (2018)
- Беттер: 1310-1322
- Бөлім: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/196191
- DOI: https://doi.org/10.1134/S102745101901018X
- ID: 196191
Дәйексөз келтіру
Аннотация
The products obtained via molecular layering on materials with a different chemical nature and structure are studied with atomic force microscopy. The atomic force microscopy of synthesis products is analyzed to control the structure and properties of coatings formed during molecular layering on matrices of various geometric shapes.
Негізгі сөздер
Авторлар туралы
E. Sosnov
Saint-Petersburg State Institute of Technology
Хат алмасуға жауапты Автор.
Email: sosnov@lti-gti.ru
Ресей, St. Petersburg, 190013
A. Kochetkova
Saint-Petersburg State Institute of Technology
Email: sosnov@lti-gti.ru
Ресей, St. Petersburg, 190013
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