Atomic Force Microscopy for Studies of Molecular Layering Products
- 作者: Sosnov E.A.1, Kochetkova A.S.1
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隶属关系:
- Saint-Petersburg State Institute of Technology
- 期: 卷 12, 编号 6 (2018)
- 页面: 1310-1322
- 栏目: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/196191
- DOI: https://doi.org/10.1134/S102745101901018X
- ID: 196191
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详细
The products obtained via molecular layering on materials with a different chemical nature and structure are studied with atomic force microscopy. The atomic force microscopy of synthesis products is analyzed to control the structure and properties of coatings formed during molecular layering on matrices of various geometric shapes.
作者简介
E. Sosnov
Saint-Petersburg State Institute of Technology
编辑信件的主要联系方式.
Email: sosnov@lti-gti.ru
俄罗斯联邦, St. Petersburg, 190013
A. Kochetkova
Saint-Petersburg State Institute of Technology
Email: sosnov@lti-gti.ru
俄罗斯联邦, St. Petersburg, 190013
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