Enviar artigo por via de e-mail Atomic Force Microscopy for Studies of Molecular Layering Products
- Autores: Sosnov E.A.1, Kochetkova A.S.1
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Afiliações:
- Saint-Petersburg State Institute of Technology
- Edição: Volume 12, Nº 6 (2018)
- Páginas: 1310-1322
- Seção: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/196191
- DOI: https://doi.org/10.1134/S102745101901018X
- ID: 196191
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Resumo
The products obtained via molecular layering on materials with a different chemical nature and structure are studied with atomic force microscopy. The atomic force microscopy of synthesis products is analyzed to control the structure and properties of coatings formed during molecular layering on matrices of various geometric shapes.
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Sobre autores
E. Sosnov
Saint-Petersburg State Institute of Technology
Autor responsável pela correspondência
Email: sosnov@lti-gti.ru
Rússia, St. Petersburg, 190013
A. Kochetkova
Saint-Petersburg State Institute of Technology
Email: sosnov@lti-gti.ru
Rússia, St. Petersburg, 190013
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