Email this article Atomic Force Microscopy for Studies of Molecular Layering Products
- Authors: Sosnov E.A.1, Kochetkova A.S.1
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Affiliations:
- Saint-Petersburg State Institute of Technology
- Issue: Vol 12, No 6 (2018)
- Pages: 1310-1322
- Section: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/196191
- DOI: https://doi.org/10.1134/S102745101901018X
- ID: 196191
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Abstract
The products obtained via molecular layering on materials with a different chemical nature and structure are studied with atomic force microscopy. The atomic force microscopy of synthesis products is analyzed to control the structure and properties of coatings formed during molecular layering on matrices of various geometric shapes.
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About the authors
E. A. Sosnov
Saint-Petersburg State Institute of Technology
Author for correspondence.
Email: sosnov@lti-gti.ru
Russian Federation, St. Petersburg, 190013
A. S. Kochetkova
Saint-Petersburg State Institute of Technology
Email: sosnov@lti-gti.ru
Russian Federation, St. Petersburg, 190013
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