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Investigation of the local characteristics of amorphous electrical steel
Virus A.A., Kaminskaya T.P., Stepovich M.A., Korovushkin V.V., Shipko M.N., Tikhonov A.I., Popov V.V.
Investigation of the surface of antifriction Al–Cu–Si–Sn–Pb aluminum alloys
Stolyarova O.O., Muravyeva T.I., Zagorskiy D.L., Gubenko M.M.
Effect of the Surface of Medical Titanium Endoprostheses on the Efficiency of Fibrointegration
Shaikhaliyev A.I., Polisan A.A., Ivanov S.Y., Parkhomenko Y.N., Malinkovich M.D., Yarygin K.N., Arazashvili L.D.
Influence of the Substrate Type on the Surface Morphology of Cu2ZnSnSe4 Thin Films
Baraishuk S.M., Tkachenko T.M., Stanchik A.V., Gremenok V.F., Bashkirov S.A., Wiertel M., Budzynski M., Turovets A.I., Yakovenko Y.S.
Atоmiс Force Microscopy of Graphene-Like Films Deposited onto Preirradiated SiO2/Si
Sedlovets D.M., Knyazev M.A., Trofimov O.V.
Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
Sybina Y.S., Borgardt N.I., Lazarenko P.I., Parsegova V.S., Prikhodko A.S., Sherchenkov A.A.
Analysis of the Structure and Composition of Fe2O3 Oxides Subjected to Magnetic Pulse Treatment
Virus A.A., Shipko M.N., Stepovich M.A., Kaminskaya T.P., Korovushkin V.V., Tikhonov A.I., Savchenko E.S.
Modification of Zinc-Implanted Silicon by Swift Xenon Ion Irradiation
Privezentsev V.V., Skuratov V.A., Kulikauskas V.S., Makunin A.V., Ksenich S.V., Steinman E.A., Tereshchenko A.N., Goryachev A.V.
Scanning Probe Microscopy of Magnetorheological Elastomers
Valiev K.K., Minaev A.Y., Stepanov G.V., Karnet Y.N., Yumashev O.B.
Influence of annealing temperature and its atmosphere on the properties of zinc implanted silicon
Privezentsev V.V., Kulikauskas V.S., Zatekin V.V., Shcherbachev K.D., Tabachkova N.Y., Eidelman K.B., Ksenich S.V., Batrakov A.A.
On the thermal oxidation of VxOy–InP heterostructures formed by the centrifugation of vanadium(V) oxide gel
Sladkopevtsev B.V., Tomina E.V., Mittova I.Y., Dontsov A.I., Pelipenko D.I.
Electron and probe microscopy investigation of the surface of elastomers modified with antifriction fillers
Stolyarova O.O., Muravyeva T.I., Gainutdinov R.V., Morozov A.V., Zagorskiy D.L., Petrova N.N., Portnyagina V.V.
Study of multilayer carbon nanotubes subjected to the impact of a nanosecond high-energy ion beam
Bolotov V.V., Knyazev E.V., Sten’kin Y.A., Ivlev K.E.
Comparative analysis of methods for measurement of the surface potential of dielectrics charging under electron-beam irradiation in a scanning electron microscope
Rau E.I., Tatarintsev A.A., Kupreenko S.Y., Zaitsev S.V., Podbutsky N.G.
Studying the formation of a true-secondary-electron signal in the low-voltage SEM mode
Kazmiruk V.V., Kurganov I.G., Osipov N.N., Podkopaev A.A., Savitskaya T.N.
Peculiarities of the initial stage of growth of niobium-based nanostructures on a Si(111)-7 × 7 surface
Putilov A.V., Muzychenko D.A., Aladyshkin A.Y.
Titanium-Carbide Formation in a Liquid Hydrocarbon Medium by Femtosecond Laser Irradiation
Kochuev D.A., Khorkov K.S., Abramov D.V., Arakelian S.M., Prokoshev V.G.
Study of the Microstructure, Crystallographic Structure and Thermal Stability of Al–Ti–Nb Alloys Produced by Selective Electron Beam Alloying
Valkov S., Neov D., Bezdushnyi R., Beskrovnyi A., Kozlenko D., Petrov P.
SEM identification of the amorphous state of Fe−B ribbons
Frolov A.M., Kraynova G.S., Dolzhikov S.V.
Investigation of secondary-emission signal formation in the low-voltage SEM mode
Kazmiruk V.V., Kurganov I.G., Osipov N.N., Podkopaev A.A., Savitskaya T.N.
Investigation of the closed porosity of functional ceramic materials by spin-echo small-angle neutron scattering
Pavlov K.A., Velichko E.V., Zabenkin V.N., Kraan W.H., Duif C.P., Bouwman W.G., Mikhailovskaya Z.A., Buyanova E.S., Grigoriev S.V.
Effect of the substrate material on the structure of carbon nanomaterials upon synthesis in a plasma jet reactor
Shavelkina M.B., Amirov R.H., Vorobyeva N.A., Katarzhis V.A.
Synthesis of Rhenium-Silicide Microcrystals in a Tin Melt
Solomkin F.Y., Orekhov A.S., Sharenkova N.V., Khavrov G.D., Isachenko G.N., Zaitseva N.V., Klechkovskaya V.V.
High-resolution X-ray diffractometry and transmission electron microscopy as applied to the structural study of InAlAs/InGaAs/InAlAs multilayer transistor nanoheterostructures
Galiev G.B., Klimov E.A., Imamov R.M., Ganin G.V., Pushkarev S.S., Maltsev P.P., Zhigalina O.M., Orekhov A.S., Vasil’ev A.L., Presniakov M.Y., Trunkin I.N.
Estimation of the SEM beam diameter by video-signal curves from a trapezoidal structure: 1. Simulation experiment
Larionov Y.V.
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