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Study of multilayer carbon nanotubes subjected to the impact of a nanosecond high-energy ion beam
Bolotov V., Knyazev E., Sten’kin Y., Ivlev K.
Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
Sybina Y., Borgardt N., Lazarenko P., Parsegova V., Prikhodko A., Sherchenkov A.
Atоmiс Force Microscopy of Graphene-Like Films Deposited onto Preirradiated SiO2/Si
Sedlovets D., Knyazev M., Trofimov O.
Modification of Zinc-Implanted Silicon by Swift Xenon Ion Irradiation
Privezentsev V., Skuratov V., Kulikauskas V., Makunin A., Ksenich S., Steinman E., Tereshchenko A., Goryachev A.
On the structural features of influenza A nucleoprotein particles from small-angle X-ray scattering data
Egorov V., Shaldzhyan A., Gorshkov A., Zabrodskaya Y., Lebedev D., Kuklin A., Ksenofontova O., Shvetsov A., Vasin A., Tsybalova L., Isaev-Ivanov V.
Effect of the Surface of Medical Titanium Endoprostheses on the Efficiency of Fibrointegration
Shaikhaliyev A., Polisan A., Ivanov S., Parkhomenko Y., Malinkovich M., Yarygin K., Arazashvili L.
Influence of the Substrate Type on the Surface Morphology of Cu2ZnSnSe4 Thin Films
Baraishuk S., Tkachenko T., Stanchik A., Gremenok V., Bashkirov S., Wiertel M., Budzynski M., Turovets A., Yakovenko Y.
Scanning Probe Microscopy of Magnetorheological Elastomers
Valiev K., Minaev A., Stepanov G., Karnet Y., Yumashev O.
Influence of annealing temperature and its atmosphere on the properties of zinc implanted silicon
Privezentsev V., Kulikauskas V., Zatekin V., Shcherbachev K., Tabachkova N., Eidelman K., Ksenich S., Batrakov A.
Electron and probe microscopy investigation of the surface of elastomers modified with antifriction fillers
Stolyarova O., Muravyeva T., Gainutdinov R., Morozov A., Zagorskiy D., Petrova N., Portnyagina V.
Investigation of the local characteristics of amorphous electrical steel
Virus A., Kaminskaya T., Stepovich M., Korovushkin V., Shipko M., Tikhonov A., Popov V.
Investigation of the surface of antifriction Al–Cu–Si–Sn–Pb aluminum alloys
Stolyarova O., Muravyeva T., Zagorskiy D., Gubenko M.
Study of the optimum conditions of a vacuum holographic microscope
Egorov N., Gileva A., Antonova L., Trofimov V., Karpov A.
Studying the formation of a true-secondary-electron signal in the low-voltage SEM mode
Kazmiruk V., Kurganov I., Osipov N., Podkopaev A., Savitskaya T.
Electron Diffraction Analysis of the Structure of Carbon Nanopillars along the Growth Direction
Volkov R., Borgardt N., Gromov D., Dubkov S.
Investigation of secondary-emission signal formation in the low-voltage SEM mode
Kazmiruk V., Kurganov I., Osipov N., Podkopaev A., Savitskaya T.
Study of the Microstructure, Crystallographic Structure and Thermal Stability of Al–Ti–Nb Alloys Produced by Selective Electron Beam Alloying
Valkov S., Neov D., Bezdushnyi R., Beskrovnyi A., Kozlenko D., Petrov P.
Modification of the Nanoglobular Structure of Glassy Carbon by Heat Treatment and Ion Irradiation
Andrianova N., Borisov A., Kazakov V., Makunin A., Mashkova E., Ovchinnikov M.
Estimation of the SEM beam diameter by video-signal curves from a trapezoidal structure: 1. Simulation experiment
Larionov Y.
Microstructural Effects in Electron-Microscopic Studies of Carbonate Rocks
Kuzmin V.
TEM Study of the microstructure of melt grown FeGe2 single crystals
Bunkin A., Kolosov V., Papushina T.
Application of ion implantation for the modification of silicon-on-sapphire epitaxial systems, their structure, and properties
Aleksandrov P., Demakov K., Shemardov S., Belova N.
Investigation of the Structure and Functional Properties of Diamond-Like Coatings Obtained by Physical Vapor Deposition
Vysotina E., Kazakov V., Polyansky M., Savushkina S., Sivtsov K., Sigalaev S., Lyakhovetsky M., Mironova S., Zilova O.
Study of hafnium-oxide coatings by means of nuclear backscattering spectrometry
Borisov A., Polyanskiy M., Savushkina S., Laptev I., Dankova T., Tkachenko N., Vostrikov V., Kamenskih A.
Determination of the Thickness of Thin Films Based on Scanning Electron Microscopy and Energy Dispersive X-Ray Analysis
Sokolov S., Milovanov R., Sidorov L.
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