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Determination of Young’s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy
Dunaevskiy M.S., Alekseev P.A., Geydt P., Lahderanta E., Haggren T., Lipsanen H.
A Study of the Chemical Composition of the 3rd Century AD Bosporan Billon Staters by XRF-Analysis, Neutron Tomography and Diffraction
Abramson M.G., Saprykina I.A., Kichanov S.E., Kozlenko D.P., Nazarov K.M.
Resonance capture of electrons and positrons in the axial channeling mode at a crystal surface
Kalashnikov N.P., Olchak A.S.
Tungsten-oxide thin films for a high-temperature semiconductor hydrogen detector based on a 6H-SiC crystal
Fominski V.Y., Grigoriev S.N., Demin M.V., Zuev V.V., Romanov R.I., Volosova M.A.
In Situ Observation of the Phase Transition of a Ferroelectric Triglycine Sulfate Crystal by Piezoresponse Force Microscopy
Tolstikhina A.L., Gainutdinov R.V., Belugina N.V.
Investigations of the Growth Processes of Bismuth-Germanate Crystals (Bi12GeO20) from the Melt using the X-Ray Diffraction Characteristics of Natural Lateral Faces
Mololkin A.A., Protsenko A.I., Blagov A.E., Vinogradov A.V., Lomonov V.A., Pisarevskii Y.V., Targonskii A.V., Eliovich Y.A.
On the application of X-ray diffraction in studying heat-transfer surfaces of steam generators
Lyubimova L.L., Makeev A.A., Zavorin A.S., Tashlykov A.A.
Effect of High-Fluence Ion Irradiation on the Structure and Electrical Properties of Polycrystalline Diamond
Anikin V.A., Borisov A.M., Kazakov V.A., Kudrin A.V., Mashkova E.S., Morkovkin A.I., Ovchinnikov M.A., Pitirimova E.A.
On the Reflection and Diffraction of Hard Gamma Quanta at the Crystal Surface
Kalashnikov N.P., Olchak A.S.
Effect of thermal and laser annealing on the atom distribution profiles in Si(111) implanted with P+ and B+ ions
Rysbaev A.S., Khujaniyozov J.B., Bekpulatov I.R., Rakhimov A.M., Pardaev O.R.
Porous Anodic Alumina Films Grown on Al(111) Single Crystals
Roslyakov I.V., Koshkodaev D.S., Lebedev V.A., Napolskii K.S.
On the Implantation of Protons into Silicon Plates in the Case of a Mechanically Stressed Surface Layer
Dyachkova I.G., Novoselova E.G., Smirnov I.S.
Effect of the Temperature Gradient on the X-ray Diffraction Spectrum of a Quartz Crystal
Mkrtchyan A.R., Potylitsyn A.P., Vukolov A.V., Novokshonov A.I., Gogolev A.S., Amiragyan R.V., Movsisyan A.E.
Structural conditionality of the physical properties of the new representatives of the family of superprotonic crystals
Selezneva E.V., Makarova I.P., Grebenev V.V., Komornikov V.A.
Polarization and Interference Effects in the Resonant Diffraction of Synchrotron Radiation
Borisov M.M., Dmitrienko V.E., Kozlovskaya K.A., Mukhamedzhanov E.K., Ovchinnikova E.N., Oreshko A.P.
Structure and Surface Morphology of Cd1–xMnxSe Epitaxial Films
Nuriyev I.R., Mehrabova M.A., Hasanov N.H.
Investigation of crystal imperfections with multiple X-Ray interferometers
Drmeyan H.R., Melkonyan A.H., Knyazyan Z.H.
Recoil energy during ion motion in a crystal
Kostina N.V., Karabaeva T.V., Evstifeev V.V.
On the Effect of the Crystal Structure in the Sputtering of Two-Component Single-Crystal Structures
Samoilov V.N., Ananieva N.G.
X-Ray Diffraction Analysis of the Influence of the Absorbed γ-Irradiation Dose on Ti3Al Structural Characteristics
Loginova M.V., Yakovlev V.I., Sitnikov A.A., Filimonov V.Y., Sobachkin A.V., Gradoboev A.V.
Method for additional purification of the surface of Si(111) single crystal
Risbaev A.S., Khujaniyazov J.B., Bekpulatov I.R., Rakhimov A.M.
Macroinhomogeneity of the properties of semiconductor crystals due to the specifics of the melt’s behavior under microgravity conditions
Strelov V.I., Zakharov B.G., Artemiev V.K.
Measuring the Transverse Sizes of an Electron Beam by the Angular Distribution of the Coherent Radiation of Electrons in a Crystal
Vnukov I.E., Goponov Y.A., Sidnin M.A., Shatokhin R.A., Sumitani K., Takabayashi Y.
Method for the X-ray Diffraction Diagnostics of Crystal Imperfections
Drmeyan H.R.
Space‒time inhomogeneity of the electron flow in pyroelectric X-ray sources
Andrianov V.A., Bush A.A., Erzinkyan A.L., Kamentsev K.E.
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