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Effect of High-Fluence Ion Irradiation on the Structure and Electrical Properties of Polycrystalline Diamond
Anikin V.A., Borisov A.M., Kazakov V.A., Kudrin A.V., Mashkova E.S., Morkovkin A.I., Ovchinnikov M.A., Pitirimova E.A.
On the Reflection and Diffraction of Hard Gamma Quanta at the Crystal Surface
Kalashnikov N.P., Olchak A.S.
Effect of thermal and laser annealing on the atom distribution profiles in Si(111) implanted with P+ and B+ ions
Rysbaev A.S., Khujaniyozov J.B., Bekpulatov I.R., Rakhimov A.M., Pardaev O.R.
Porous Anodic Alumina Films Grown on Al(111) Single Crystals
Roslyakov I.V., Koshkodaev D.S., Lebedev V.A., Napolskii K.S.
On the Implantation of Protons into Silicon Plates in the Case of a Mechanically Stressed Surface Layer
Dyachkova I.G., Novoselova E.G., Smirnov I.S.
Effect of the Temperature Gradient on the X-ray Diffraction Spectrum of a Quartz Crystal
Mkrtchyan A.R., Potylitsyn A.P., Vukolov A.V., Novokshonov A.I., Gogolev A.S., Amiragyan R.V., Movsisyan A.E.
Structural conditionality of the physical properties of the new representatives of the family of superprotonic crystals
Selezneva E.V., Makarova I.P., Grebenev V.V., Komornikov V.A.
Polarization and Interference Effects in the Resonant Diffraction of Synchrotron Radiation
Borisov M.M., Dmitrienko V.E., Kozlovskaya K.A., Mukhamedzhanov E.K., Ovchinnikova E.N., Oreshko A.P.
Structure and Surface Morphology of Cd1–xMnxSe Epitaxial Films
Nuriyev I.R., Mehrabova M.A., Hasanov N.H.
Investigation of crystal imperfections with multiple X-Ray interferometers
Drmeyan H.R., Melkonyan A.H., Knyazyan Z.H.
Recoil energy during ion motion in a crystal
Kostina N.V., Karabaeva T.V., Evstifeev V.V.
On the Effect of the Crystal Structure in the Sputtering of Two-Component Single-Crystal Structures
Samoilov V.N., Ananieva N.G.
X-Ray Diffraction Analysis of the Influence of the Absorbed γ-Irradiation Dose on Ti3Al Structural Characteristics
Loginova M.V., Yakovlev V.I., Sitnikov A.A., Filimonov V.Y., Sobachkin A.V., Gradoboev A.V.
Method for additional purification of the surface of Si(111) single crystal
Risbaev A.S., Khujaniyazov J.B., Bekpulatov I.R., Rakhimov A.M.
Macroinhomogeneity of the properties of semiconductor crystals due to the specifics of the melt’s behavior under microgravity conditions
Strelov V.I., Zakharov B.G., Artemiev V.K.
Measuring the Transverse Sizes of an Electron Beam by the Angular Distribution of the Coherent Radiation of Electrons in a Crystal
Vnukov I.E., Goponov Y.A., Sidnin M.A., Shatokhin R.A., Sumitani K., Takabayashi Y.
Method for the X-ray Diffraction Diagnostics of Crystal Imperfections
Drmeyan H.R.
Space‒time inhomogeneity of the electron flow in pyroelectric X-ray sources
Andrianov V.A., Bush A.A., Erzinkyan A.L., Kamentsev K.E.
Orientational dependence of the creation and annihilation of electron–positron pairs in a single-crystal at high energies
Kalashnikov N.P., Olchak A.S.
Refinement of the Atomic and Magnetic Structures of Solid Solutions BaFe12 – xInxO19 (x = 0.1–1.2) by the Neutron Diffraction Method
Turchenko V.A., Balagurov A.M., Trukhanov S.V., Trukhanov A.V.
Multipopulation Genetic Algorithm for Determining Crystal Structures Using Powder Diffraction Data
Zaloga A.N., Yakimov I.S., Dubinin P.S.
Parameter optimization upon the self-assembly of a linear carbon chain by molecular dynamics in reactive force field simulations
Mikhailov F.N.
Effect of low-energy X-ray radiation on the electrophysical properties of silicon crystals of n- and p-type conductivity
Steblenko L.P., Podolyan A.A., Nadtochiy A.B., Kuryliuk A.N., Kalinichenko D.V., Kobzar Y.L., Krit A.N., Naumenko S.N.
Determination of Young’s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy
Dunaevskiy M.S., Alekseev P.A., Geydt P., Lahderanta E., Haggren T., Lipsanen H.
A Study of the Chemical Composition of the 3rd Century AD Bosporan Billon Staters by XRF-Analysis, Neutron Tomography and Diffraction
Abramson M.G., Saprykina I.A., Kichanov S.E., Kozlenko D.P., Nazarov K.M.
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