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Mechanical Properties of Thin AlSiN Films, Studied by Nanoindentation, as a Thermal-Stability Criterion
Kuznetsova T.A., Zubar T.I., Lapitskaya V.A., Sudzilovskaya K.A., Chizhik S.A., Uglov V.V., Shymanski V.I., Kvasov N.T.
On the Synthesis of PdO−RuO2 Solid-Solution Thin Films by Thermal Oxidation and Investigation of Their Gas-Sensing Properties
Kuschev S.B., Ryabtsev S.V., Soldatenko S.A., Sinelnikov A.A., Dontsov A.I., Maksimenko A.A., Turaeva T.L.
XPS Study of Niobium and Niobium-Nitride Nanofilms
Lubenchenko A.V., Batrakov A.A., Shurkaeva I.V., Pavolotsky A.B., Krause S., Ivanov D.A., Lubenchenko O.I.
Spontaneous and Induced Magnetization Reversal in Thin GaMnSb Films
Filatov A.A., Kostyuchenko S.A., Dmitriev A.I.
Radiation-induced modification of reflection spectra beyond the ion path region in polyimide films
Brinkevich D.I., Kharchenko A.A., Brinkevich S.D., Lukashevich M.G., Odzhaev V.B., Valeev V.F., Nuzhdin V.I., Khaibullin R.I.
Determination of the element distribution in films deposited using the plasma focus facility by Rutherford backscattering
Kolokoltsev V.N., Kulikauskas V.S., Bondarenko G.G., Eriskin A.A., Nikulin V.Y., Silin P.V.
Kinetics of the formation of oxide nanostructures on n-Si in the potentiostatic mode of water anodization
Orlov A.M., Yavtushenko I.O., Makhmud-Akhunov M.Y., Solovyev A.A.
Diagnostics of the Elemental Composition of PZT Films on Platinum by X-Ray Microprobe Analysis
Beshenkov V.G., Znamenskii A.G., Marchenko V.A., Nekrasov A.N.
Electron Spectroscopy of Thin Nanocarbon Films
Nishchak O.Y., Savchenko N.F., Streletsky O.A., Khvostov V.V., Zykova E.Y.
Study of Local Charge Accumulation in ZrO2(Y) Films with Au Nanoparticles by Kelvin Probe Force Microsсopy
Koryazhkina M.N., Filatov D.O., Antonov I.N., Ryabova M.A., Dunaevskii M.S.
Comparative Analysis of the Effect of RF and DC Magnetron Sputtering Parameters on the Structure Formation of Tantalum-Diboride Thin Films
Goncharov A.A., Yunda A.N., Bazhin A.I., Shelest I.V., Buranich V.V.
Ion-Beam Synthesis of Ferromagnetic Films by the Implantation of Co+ Ions into Silicon
Chirkov V.V., Gumarov G.G., Petukhov V.Y., Denisov A.E.
Application of ion implantation for the modification of silicon-on-sapphire epitaxial systems, their structure, and properties
Aleksandrov P.A., Demakov K.D., Shemardov S.G., Belova N.E.
Current status and development prospects for multilayer X-ray optics at the Institute for Physics of Microstructures, Russian Academy of Sciences
Akhsakhalyan A.D., Kluenkov E.B., Lopatin A.Y., Luchin V.I., Nechay A.N., Pestov A.E., Polkovnikov V.N., Salashchenko N.N., Svechnikov M.V., Toropov M.N., Tsybin N.N., Chkhalo N.I., Shcherbakov A.V.
The effect of silicon-substrate orientation on the local piezoelectric characteristics of LiNbO3 films
Kiselev D.A., Zhukov R.N., Ksenich S.V., Kubasov I.V., Temirov A.A., Timushkin N.G., Bykov A.S., Malinkovich M.D., Shvartsman V.V., Lupascu D.C., Parkhomenko Y.N.
Kinetics of phase transformations in thin CuIn5Se8 films
Mamedova A.C., Kerimova N.K., Ismayilov D.I., Bagirova S.M., Nuriyeva A.M.
Determination of the Thickness of Thin Films Based on Scanning Electron Microscopy and Energy Dispersive X-Ray Analysis
Sokolov S.A., Milovanov R.A., Sidorov L.N.
PLD Grown SiC Thin Films on Al2O3: Morphology and Structure
Kargin N.I., Gusev A.S., Ryndya S.M., Timofeev A.A., Grekhov M.M., Siglovaya N.V., Antonenko S.V.
Atomic Force Microscopy for Studies of Molecular Layering Products
Sosnov E.A., Kochetkova A.S.
Structure and Surface Morphology of Cd1–xMnxSe Epitaxial Films
Nuriyev I.R., Mehrabova M.A., Hasanov N.H.
Study of Thin Film Coatings by IR Phonon-Polariton Spectroscopy Methods
Vinogradov E.A., Yakovlev V.A.
Quantum size effect observed during the small-angle reflection of an electron beam incident onto a single-crystal film with allowance for the average internal lattice potential
Shkornyakov S.M.
Analysis of the composition of graphene-oxide films using a backscattered H+ ion beam
Mokrushin A.D., Egorov E.V., Smirnov V.A.
Morphology of anodic alumina films obtained by hard anodization: Influence of the rate of anodization voltage increase
Roslyakov I.V., Kuratova N.S., Koshkodaev D.S., Merino D.H., Lukashin A.V., Napolskii K.S.
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