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Crystal Structure of the Intermetallic Thin-Film Cu–Sn Condensate
Makrushina A., Plotnikov V., Demyanov B., Makarov S.
Study of Resonance Phenomena During Thin-Film Perforation upon the Passage of Multicharged Ions
Filippov G., Aleksandrov V., Stepanov A.
On the Synthesis of PdO−RuO2 Solid-Solution Thin Films by Thermal Oxidation and Investigation of Their Gas-Sensing Properties
Kuschev S., Ryabtsev S., Soldatenko S., Sinelnikov A., Dontsov A., Maksimenko A., Turaeva T.
Study of Thin Film Coatings by IR Phonon-Polariton Spectroscopy Methods
Vinogradov E., Yakovlev V.
Features of the electrical conductivity of Fe, Ni, Ti, and Pt nanoisland films: Hysteresis and ion-field processes
Tomilin S., Berzhansky V., Yanovsky A., Tomilina O.
Structural Surface Features of Tellurium-Doped Bismuth Films
Matveev D.
Mechanical Properties of Thin AlSiN Films, Studied by Nanoindentation, as a Thermal-Stability Criterion
Kuznetsova T., Zubar T., Lapitskaya V., Sudzilovskaya K., Chizhik S., Uglov V., Shymanski V., Kvasov N.
The effect of silicon-substrate orientation on the local piezoelectric characteristics of LiNbO3 films
Kiselev D., Zhukov R., Ksenich S., Kubasov I., Temirov A., Timushkin N., Bykov A., Malinkovich M., Shvartsman V., Lupascu D., Parkhomenko Y.
Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
Sybina Y., Borgardt N., Lazarenko P., Parsegova V., Prikhodko A., Sherchenkov A.
Electron Spectroscopy of Thin Nanocarbon Films
Nishchak O., Savchenko N., Streletsky O., Khvostov V., Zykova E.
XPS Study of Niobium and Niobium-Nitride Nanofilms
Lubenchenko A., Batrakov A., Shurkaeva I., Pavolotsky A., Krause S., Ivanov D., Lubenchenko O.
Spontaneous polarization of finely disperse dielectrics with surface donor centers
Kharlamov V.
Diagnostics of the Elemental Composition of PZT Films on Platinum by X-Ray Microprobe Analysis
Beshenkov V., Znamenskii A., Marchenko V., Nekrasov A.
PLD Grown SiC Thin Films on Al2O3: Morphology and Structure
Kargin N., Gusev A., Ryndya S., Timofeev A., Grekhov M., Siglovaya N., Antonenko S.
Study of Local Charge Accumulation in ZrO2(Y) Films with Au Nanoparticles by Kelvin Probe Force Microsсopy
Koryazhkina M., Filatov D., Antonov I., Ryabova M., Dunaevskii M.
Influence of Oxygen Vacancies on the Magnetic Properties of Zn1 – xCoxOy Films
Lotin A., Kuz’mina A., Novodvorsky O., Parshina L., Mikhalevsky V., Khramova O., Cherebilo E., Perov N., Makarova L., Shneider A., Kuz’min M.
Quantum size effect observed during the small-angle reflection of an electron beam incident onto a single-crystal film with allowance for the average internal lattice potential
Shkornyakov S.
Determination of the Thickness of Thin Films Based on Scanning Electron Microscopy and Energy Dispersive X-Ray Analysis
Sokolov S., Milovanov R., Sidorov L.
Vanadium- and Titanium Dioxide-Based Memristors Fabricated via Pulsed Laser Deposition
Novodvorsky O., Parshina L., Lotin A., Mikhalevsky V., Khramova O., Cherebylo E., Panchenko V.
Microstructure, phase analysis and dielectric response of thin Pb(Zr,Ti)O3 films at the morphotropic phase boundary
Pronin I., Pronin V., Kanareikin A., Dolgintsev D., Kaptelov E., Senkevich S.
Kinetics of the formation of oxide nanostructures on n-Si in the potentiostatic mode of water anodization
Orlov A., Yavtushenko I., Makhmud-Akhunov M., Solovyev A.
On the Effect of the Crystal Structure in the Sputtering of Two-Component Single-Crystal Structures
Samoilov V., Ananieva N.
Magnetic Anisotropy in Thin Films of FePt Detected by the Ferromagnetic Resonance Method
Dmitriev A., Kulikov A., Gilmutdinov I., Dremova N., Mazitov A., Dmitrieva M., Alekseev S., Myagkov V.
Atomic Force Microscopy for Studies of Molecular Layering Products
Sosnov E., Kochetkova A.
Structural and Dielectric Properties of Organic Ferroelectric 2-Methylbenzimidazole
Balashova E., Krichevtsov B., Svinarev F., Zaitseva N., Pankova G.
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