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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

S

Seliverstov, D. I.
Selutin, A. G.
Semenenko, K. I.
Semenov, A. A.
Semenov, N. M.
Semenov, V. G.
Semin, A. P.
Semina, O. A.
Semushin, K. A.
Senin, R. A.
Senkevich, S. V.
Serebrennikov, D. A.
Serebrov, A. P.
Seredin, P. V.
Seregina, E. V.
Sergeeva, K. A.
Sergeeva, Y. E.
Sergey, Konovalov
Serikov, D. V.
Serov, A. V.
Serov, S. A.
Sertsu, M. G.
Severin, E. A.
Severina, E. V.
Sevjidsuren, G.

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