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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Y

Yafarov, A. R.
Yafarov, R. K.
Yakimchuk, D. V.
Yakimov, A. I.
Yakimov, E. B.
Yakimov, I. S.
Yakovenko, A. G.
Yakovenko, Y. S.
Yakovlev, V. A.
Yakovleva, I. L.
Yakovleva, N. M.
Yakunin, S. N.
Yakunov, A. V.
Yamashev, G. G.
Yang, B.
Yang, Jianshe
Yanovsky, A. S.
Yans, Yu. G.
Yants, V. E.
Yapryntsev, A. D.
Yaradaikin, S. P.
Yarygin, K. N.
Yashina, E. G.
Yastrebinsky, R. N.
Yasuda, N.

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